ABSTRACTA continuum equation for epitaxial and thin-film growth in which diffusion along the surface is the dominant relaxation process and the full diffusion along the surface is taken into account, is studied. The interface width is found to grow linearly with time (height) in agreement with recent experiments. At late times dynamic scaling breaks down and the surface develops a characteristic morphology which is similar to that found in experiments.
Continuum model description of thin-film growth morphology
