Determination of the Pulse Duration of an X-Ray Free Electron Laser Using Highly Resolved Single-Shot Spectra

2012 ◽  
Vol 109 (14) ◽  
Author(s):  
Yuichi Inubushi ◽  
Kensuke Tono ◽  
Tadashi Togashi ◽  
Takahiro Sato ◽  
Takaki Hatsui ◽  
...  
Keyword(s):  
Pulse Duration ◽  
Free Electron ◽  
Free Electron Laser ◽  
Single Shot ◽  
X Ray

Determination of X-ray pulse duration via intensity correlation measurements of X-ray fluorescence

2019 ◽  
Vol 26 (6) ◽  
pp. 2050-2054 ◽  
Author(s):  
Ichiro Inoue ◽  
Kenji Tamasaku ◽  
Taito Osaka ◽  
Yuichi Inubushi ◽  
Makina Yabashi
Keyword(s):  
Pulse Duration ◽  
Free Electron ◽  
Free Electron Laser ◽  
Coherence Time ◽  
Metal Foil ◽  
Intensity Correlation ◽  
Simple Method ◽  
X Ray

A simple method using X-ray fluorescence is proposed to diagnose the duration of an X-ray free-electron laser (XFEL) pulse. This work shows that the degree of intensity correlation of the X-ray fluorescence generated by irradiating an XFEL pulse on metal foil reflects the magnitude relation between the XFEL duration and the coherence time of the fluorescence. Through intensity correlation measurements of copper Kα fluorescence, the duration of 12 keV XFEL pulses from SACLA was evaluated to be ∼10 fs.

scholarly journals Erratum: Single Shot Coherence Properties of the Free-Electron Laser SACLA in the Hard X-ray Regime

2014 ◽  
Vol 4 (1) ◽  
Author(s):  
Felix Lehmkühler ◽  
Christian Gutt ◽  
Birgit Fischer ◽  
Martin A. Schroer ◽  
Marcin Sikorski ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Single Shot ◽  
X Ray

scholarly journals Single Shot Coherence Properties of the Free-Electron Laser SACLA in the Hard X-ray Regime

2014 ◽  
Vol 4 (1) ◽  
Author(s):  
Felix Lehmkühler ◽  
Christian Gutt ◽  
Birgit Fischer ◽  
Martin A. Schroer ◽  
Marcin Sikorski ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Single Shot ◽  
X Ray

scholarly journals Start-to-end simulation of single-particle imaging using ultra-short pulses at the European X-ray Free-Electron Laser

IUCrJ ◽  
2017 ◽  
Vol 4 (5) ◽  
pp. 560-568 ◽  
Author(s):  
Carsten Fortmann-Grote ◽  
Alexey Buzmakov ◽  
Zoltan Jurek ◽  
Ne-Te Duane Loh ◽  
Liubov Samoylova ◽  
...  
Keyword(s):  
Pulse Duration ◽  
Diffraction Data ◽  
Single Particle ◽  
Free Electron ◽  
Free Electron Laser ◽  
Structural Information ◽  
X Ray ◽  
Particle Imaging ◽  
Single Particle Imaging ◽  
The Impact

Single-particle imaging with X-ray free-electron lasers (XFELs) has the potential to provide structural information at atomic resolution for non-crystalline biomolecules. This potential exists because ultra-short intense pulses can produce interpretable diffraction data notwithstanding radiation damage. This paper explores the impact of pulse duration on the interpretability of diffraction data using comprehensive and realistic simulations of an imaging experiment at the European X-ray Free-Electron Laser. It is found that the optimal pulse duration for molecules with a few thousand atoms at 5 keV lies between 3 and 9 fs.

scholarly journals Spectral monitoring at SwissFEL using a high-resolution on-line hard X-ray single-shot spectrometer

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Christian David ◽  
Gediminas Seniutinas ◽  
Mikako Makita ◽  
Benedikt Rösner ◽  
Jens Rehanek ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Reference Data ◽  
Diffraction Order ◽  
Laser Pulses ◽  
Single Shot ◽  
Spectral Measurements ◽  
X Ray ◽  
On Line ◽  
Spectral Monitoring

The performance and parameters of the online photon single-shot spectrometer (PSSS) at the Aramis beamline of the SwissFEL free-electron laser are presented. The device operates between the photon energies 4 and 13 keV and uses diamond transmission gratings and bent Si crystals for spectral measurements on the first diffraction order of the beam. The device has an energy window of 0.7% of the median photon energy of the free-electron laser pulses and a spectral resolution (full width at half-maximum) ΔE/E on the order of 10−5. The device was characterized by comparing its performance with reference data from synchrotron sources, and a parametric study investigated other effects that could affect the reliability of the spectral information.

Single-shot arrival timing diagnostics for a soft X-ray free-electron laser beamline at SACLA

2018 ◽  
Vol 25 (1) ◽  
pp. 68-71 ◽  
Author(s):  
Shigeki Owada ◽  
Kyo Nakajima ◽  
Tadashi Togashi ◽  
Tetsuo Kayatama ◽  
Makina Yabashi
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Imaging System ◽  
Laser Pulses ◽  
Single Shot ◽  
Simultaneous Operation ◽  
One Dimensional ◽  
X Ray ◽  
Arrival Timing ◽  
Optical Laser

Arrival timing diagnostics performed at a soft X-ray free-electron laser (FEL) beamline of SACLA are described. Intense soft X-ray FEL pulses with one-dimensional focusing efficiently induce transient changes of optical reflectivity on the surface of GaAs. The arrival timing between soft X-ray FEL and optical laser pulses was successfully measured as a spatial position of the reflectivity change. The temporal resolution evaluated from the imaging system reaches ∼10 fs. This method requires only a small portion of the incident pulse energy, which enables the simultaneous operation of the arrival timing diagnostics and experiments by introducing a wavefront-splitting scheme.

Determination of x-ray free electron laser power using a room-temperature calorimeter

Metrologia ◽  
2016 ◽  
Vol 53 (1) ◽  
pp. 98-102 ◽  
Author(s):  
T Tanaka ◽  
M Kato ◽  
N Saito ◽  
K Tono ◽  
M Yabashi ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Laser Power ◽  
Room Temperature ◽  
X Ray
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