A new method for determining the index of refraction from normal incidence reflection and transmission measurements has been developed. Several other methods are reviewed to explain why a new method is needed. The author's method used a thickness variational approach. For an accurate determination of n and k, the method requires normal incidence reflection and transmission measurements over a fairly broad spectral range for at least two different film thicknesses. These requirements are unavoidable for normal incidence methods.
Accurate and Facile Determination of the Index of Refraction of Organic Thin Films Near the Carbon1sAbsorption Edge