A Method for Calculating the Index of Refraction of Thin Films

1975 ◽  
Vol 53 (18) ◽  
pp. 1737-1742 ◽  
Author(s):  
J. H. Wohlgemuth ◽  
D. E. Brodie
Keyword(s):  
Thin Films ◽  
Spectral Range ◽  
Variational Approach ◽  
Accurate Determination ◽  
Normal Incidence ◽  
Index Of Refraction ◽  
New Method ◽  
Reflection And Transmission ◽  
Transmission Measurements

A new method for determining the index of refraction from normal incidence reflection and transmission measurements has been developed. Several other methods are reviewed to explain why a new method is needed. The author's method used a thickness variational approach. For an accurate determination of n and k, the method requires normal incidence reflection and transmission measurements over a fairly broad spectral range for at least two different film thicknesses. These requirements are unavoidable for normal incidence methods.

A new method for mechanical testing of thin films: Application to aluminum

2009 ◽  
Vol 24 (4) ◽  
pp. 1353-1360
Author(s):  
T. Kruml ◽  
M. Stranyanek ◽  
R. Ctvrtlik ◽  
P. Bohac ◽  
T. Vystavel ◽  
...  
Keyword(s):  
Thin Films ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Accurate Determination ◽  
Film Surface ◽  
Strain Curve ◽  
New Method ◽  
Plastic Properties ◽  
Precise Knowledge

A new method for measuring plastic properties of thin films deposited on a substrate is presented. Micrometric cylindrical specimens with the axis perpendicular to the film surface were prepared by milling out the surrounding material using the focused ion beam technique. Such specimens were deformed by means of a nanoindenter outfitted with a flat diamond tip. An equivalent to the macroscopic compressive curve was obtained. Elastic modulus and hardness of the film were then measured using a Berkovich tip. The precise knowledge of the gage length and the independent measurement of elastic properties enable the accurate determination of the stress–strain curve. As compared with the results published in the literature on the specimens with the same dimensions, the studied material deforms less heterogeneously, probably as a consequence of the symmetric crystallographic orientation of the specimens.

Boundary Effects on the Determination of Metamaterial Parameters From Normal Incidence Reflection and Transmission Measurements

2011 ◽  
Vol 59 (6) ◽  
pp. 2226-2240 ◽  
Author(s):  
Sung Kim ◽  
Edward F. Kuester ◽  
Christopher L. Holloway ◽  
Aaron D. Scher ◽  
James Baker-Jarvis
Keyword(s):  
Normal Incidence ◽  
Boundary Effects ◽  
Reflection And Transmission ◽  
Transmission Measurements

Improved method for determination of optical constants of organic thin films from reflection and transmission measurements

2000 ◽  
Vol 39 (7) ◽  
pp. 1174 ◽  
Author(s):  
Aleksandra B. Djurišić ◽  
Torsten Fritz ◽  
Karl Leo ◽  
E. Herbert Li
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Organic Thin Films ◽  
Improved Method ◽  
Reflection And Transmission ◽  
Transmission Measurements

Optical Properties of RF-Sputtered a-SiGe:H:O Alloys

1986 ◽  
Vol 77 ◽  
Author(s):  
J. M. T. Pereira ◽  
P. K. Banerjee ◽  
S. S. Mitra
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Optical Constants ◽  
Rf Sputtering ◽  
Normal Incidence ◽  
Reflection And Transmission ◽  
Amorphous Thin Films ◽  
Optical Gap ◽  
Transmission Measurements ◽  
Substrate Temperatures

ABSTRACTAmorphous thin films of SixGe1-x:O (x = 0.70) were prepared by RF-sputtering at several substrate temperatures. The structural properties of these films were studied by IR spectroscopy and revealed features characteristic of hydrogen and/or oxygen bonded to silicon. The optical constants (n,k) were determined from reflection and transmission measurements at near-normal incidence for photon energies in the range of 1 eV and 2.6 eV. The optical gap was derived from the Taue plot and correlated with the composition of the samples. The increase of hydrogen and/or oxygen decreases the value of the refractive index and increases the optical gap.

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination

K, Ca, Mg, and Zn in platelets, as determined by atomic absorption spectrometry with use of a sealed decomposition bomb and discrete nebulization.

1985 ◽  
Vol 31 (4) ◽  
pp. 609-612 ◽  
Author(s):  
T Makino
Keyword(s):  
Metal Ions ◽  
Atomic Absorption Spectrometry ◽  
Atomic Absorption ◽  
Accurate Determination ◽  
Absorption Spectrometry ◽  
New Method ◽  
Differential Centrifugation ◽  
Individual Variations

Abstract In this new method for precise and accurate determination of K, Ca, Mg, and Zn in platelets, small amounts of platelets, prepared by differential centrifugation and cell washing, are decomposed in a homemade mini-vessel, a sealed Teflon bomb. The metal ions in the decomposed sample are measured by atomic absorption spectrometry with discrete nebulization. Overall, CVs ranged from 0.8 to 4.8%. We investigated sex-related differences (none were found) and intra-individual variations.

New Method for Accurate Determination of Polyphenol Oxidase Activity Based on Reduction in SERS Intensity of Catechol

2018 ◽  
Vol 66 (42) ◽  
pp. 11180-11187 ◽  
Author(s):  
Ting-tiao Pan ◽  
Da-Wen Sun ◽  
Jitendra Paliwal ◽  
Hongbin Pu ◽  
Qingyi Wei
Keyword(s):  
Polyphenol Oxidase ◽  
Oxidase Activity ◽  
Accurate Determination ◽  
New Method ◽  
Polyphenol Oxidase Activity ◽  
Sers Intensity

An enzymic creatinine assay and a direct ammonia assay in coated thin films.

1983 ◽  
Vol 29 (4) ◽  
pp. 645-649 ◽  
Author(s):  
M W Sundberg ◽  
R W Becker ◽  
T W Esders ◽  
J Figueras ◽  
C T Goodhue
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Linear Regression ◽  
Accurate Determination ◽  
Bromphenol Blue ◽  
Keto Acids ◽  
Liquid Chromatographic ◽  
Enzymic Assay ◽  
Paired Analysis

Abstract We developed a thin-film enzymic assay for creatinine that makes use of creatinine iminohydrolase (EC 3.5.4.21) to convert creatinine to N-methylhydantoin and ammonia. The ammonia diffuses through a semipermeable layer and is quantitated by reaction with bromphenol blue. A paired analysis of the sample on a separate coating without the enzymic reaction measures endogenous ammonia and, for samples with normal concentrations of ammonia, allows accurate determination of serum creatinine to 150 mg/L without dilution. Results of this assay (y) compare well with those by a liquid-chromatographic comparison assay (x) by linear regression (slope = 0.935, intercept = 1.13 mg/L, r2 = 0.995). It is insensitive to many substances, such as ketones and keto acids, that interfere with conventional assays. Results of the ammonia assay (y) correlate well with those by a semi-automated enzymic assay (x) based on glutamate dehydrogenase (slope = 1.068, intercept = 17.3 mumol/L, r2 = 0.985).

A New General Method for the Determination of Optical Properties of Amorphous Silicon Films

1990 ◽  
Vol 192 ◽  
Author(s):  
G. Amato ◽  
L. Boarino ◽  
F. Fizzotti ◽  
C. Manfredotti
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Amorphous Silicon ◽  
Optical Response ◽  
The Other ◽  
New Method ◽  
Silicon Thin Films ◽  
Physical Insight ◽  
General Method

ABSTRACTWe propose to apply a new method to model the optical response of amorphous silicon thin films. This method presents the advantage of having a good physical insight. On the other hand, although the model has been originally tested on different materials like a-Si, a-Ge and a-GaAs, we show that it is also sensitive to small differences like those that can exist between intrinsic and doped a-Si:H.

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