scholarly journals Weak-measurement-induced phases and dephasing: Broken symmetry of the geometric phase

2021 ◽  
Vol 3 (4) ◽  
Author(s):  
Kyrylo Snizhko ◽  
Nihal Rao ◽  
Parveen Kumar ◽  
Yuval Gefen
Keyword(s):  
Geometric Phase ◽  
Weak Measurement ◽  
Broken Symmetry

Geometric phase in quantum eraser and weak measurement

2011 ◽  
Author(s):  
S. Tamate ◽  
H. Kobayashi ◽  
T. Nakanishi ◽  
K. Sugiyama ◽  
M. Kitano ◽  
...  
Keyword(s):  
Geometric Phase ◽  
Weak Measurement ◽  
Quantum Eraser

Geometric phase topology in weak measurement

2017 ◽  
Vol 19 (12) ◽  
pp. 125401
Author(s):  
C T Samlan ◽  
Nirmal K Viswanathan
Keyword(s):  
Geometric Phase ◽  
Weak Measurement

Broken symmetry and magnetoacoustic effects in ferroand antiferromagnetics

1983 ◽  
Vol 140 (7) ◽  
pp. 429 ◽  
Author(s):  
Evgenii A. Turov ◽  
Vladimir G. Shavrov
Keyword(s):  
Broken Symmetry

Local Lattice Strain Measurement Using Geometric Phase Analysis of Dark Field Images from Scanning Transmission Electron Microscopy

2011 ◽  
Author(s):  
Jayhoon Chung ◽  
Guoda Lian ◽  
Lew Rabenberg
Keyword(s):  
Phase Analysis ◽  
Geometric Phase ◽  
Process Development ◽  
Local Strain ◽  
Strain Engineering ◽  
Dark Field ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Geometric Phase Analysis ◽  
Scanning Transmission

Abstract Since strain engineering plays a key role in semiconductor technology development, a reliable and reproducible technique to measure local strain in devices is necessary for process development and failure analysis. In this paper, geometric phase analysis of high angle annular dark field - scanning transmission electron microscope images is presented as an effective technique to measure local strains in the current node of Si based transistors.

Nanoscale film thickness measurement based on weak measurement

2020 ◽  
Vol 91 (12) ◽  
pp. 123111
Author(s):  
Zirui Qin ◽  
Qinggang Liu ◽  
Chong Yue ◽  
Yaopu Lang ◽  
Xinglin Zhou
Keyword(s):  
Film Thickness ◽  
Thickness Measurement ◽  
Weak Measurement ◽  
Film Thickness Measurement

Ultraviolet wavefront manipulation using topological insulator metasurfaces based on geometric phase

2021 ◽  
Vol 487 ◽  
pp. 126812
Author(s):  
Mingli Wan ◽  
Pengfei Ji ◽  
Rongrong Wang ◽  
Xiaopeng Zhang ◽  
Mingli Tian ◽  
...  
Keyword(s):  
Topological Insulator ◽  
Geometric Phase

GEOMETRIC PHASE AND DISENTANGLEMENT OF A MOVING FOUR-LEVEL ATOM IN THE PRESENCE OF NONLINEAR MEDIUM

2012 ◽  
Vol 10 (01) ◽  
pp. 1250007 ◽  
Author(s):  
NOUR ZIDAN ◽  
S. ABDEL-KHALEK ◽  
M. ABDEL-ATY
Keyword(s):  
System Dynamics ◽  
Geometric Phase ◽  
Nonlinear Medium ◽  
Atomic Motion ◽  
Kerr Medium ◽  
Mode Structure ◽  
Field Mode ◽  
Level Atom

In this paper, we investigate the geometric phase of the field interacting with a moving four-level atom in the presence of Kerr medium. The results show that the atomic motion, the field-mode structure and Kerr medium play important roles in the evolution of the system dynamics. As illustration, we examine the behavior of the geometric phase and entanglement with experimentally accessible parameters. Some new aspects are observed and discussed.

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