Indexation scheme for oriented molecular thin films studied with grazing-incidence reciprocal-space mapping

2007 ◽  
Vol 40 (4) ◽  
pp. 716-718 ◽  
Author(s):  
Detlef-M. Smilgies ◽  
Daniel R. Blasini
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Small Molecules ◽  
Organic Electronics ◽  
Grazing Incidence ◽  
Space Mapping ◽  
Reciprocal Space ◽  
Molecular Structures ◽  
Reciprocal Space Mapping ◽  
Mapping Scheme

Thin films of small molecules relevant to organic electronics applications often show a confusing degree of polymorphism. An effective reciprocal-space mapping scheme has been developed in order to find and index thin-film reflections which are related to previously known molecular structures. By method of elimination, thin-film reflections due to novel thin-film phases can thus be identified.

Grazing-incidence X-ray scattering of lamellar thin films

2019 ◽  
Vol 52 (2) ◽  
pp. 247-251
Author(s):  
Detlef-M. Smilgies
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Small Molecules ◽  
Film Studies ◽  
Grazing Incidence ◽  
Semicrystalline Polymers ◽  
X Ray ◽  
X Ray Scattering ◽  
Incident Plane ◽  
Ray Scattering

Recently, surface and thin-film studies using area detectors have become prevalent. An important class of such systems are lamellar thin films formed by small molecules, liquid crystals or semicrystalline polymers. Frequently, the lamellae align more or less parallel to the substrate. Such structures can be easily discerned by their characteristic X-ray scattering close to the incident plane. This paper describes how such patterns can be simulated, in order to extract morphological information about the thin film.

Preparation of Epitaxial BaTiO3 Thin Films by the Dipping-pyrolysis Process

1997 ◽  
Vol 12 (4) ◽  
pp. 1141-1144 ◽  
Author(s):  
S. Kim ◽  
T. Manabe ◽  
I. Yamaguchi ◽  
T. Kumagai ◽  
S. Mizuta
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Pole Figure ◽  
Space Mapping ◽  
Reciprocal Space ◽  
Pyrolysis Process ◽  
Amorphous Precursor ◽  
Reciprocal Space Mapping ◽  
Pseudocubic Phase ◽  
Tetragonal Batio

Epitaxial BaTiO3 thin films were prepared on SrTiO3 (100) substrates by the dipping-pyrolysis process using metal naphthenates as starting materials. Highly oriented BaTiO3 thin films were crystallized by heat treatment at 800 °C and higher, from amorphous precursor films pyrolyzed at 470 °C. XRD pole-figure and reciprocal-space mapping analyses showed that the films were epitaxially grown on SrTiO3substrates and were pseudocubic phase with an a║/aτ ratio of 1.003, smaller than the c0/a0 ratio (=1.011) of bulk tetragonal BaTiO3.

Real and reciprocal space mapping of the mosaic dispersion in self‐nucleated AlxGa1−xN thin films on (00.1) sapphire

1995 ◽  
Vol 67 (25) ◽  
pp. 3771-3773 ◽  
Author(s):  
T. J. Kistenmacher ◽  
D. K. Wickenden ◽  
M. E. Hawley ◽  
R. P. Leavitt
Keyword(s):  
Thin Films ◽  
Space Mapping ◽  
Reciprocal Space ◽  
Reciprocal Space Mapping

scholarly journals X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene

2007 ◽  
Vol 90 (18) ◽  
pp. 181930 ◽  
Author(s):  
Hiroyuki Yoshida ◽  
Katsuhiko Inaba ◽  
Naoki Sato
Keyword(s):  
Thin Film ◽  
Space Mapping ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Mapping Study ◽  
Reciprocal Space Mapping ◽  
X Ray
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