scholarly journals Simulation of X-ray diffraction line broadening caused by stress gradients and determination of surface stress distribution by Fourier analysis

2012 ◽  
Vol 68 (a1) ◽  
pp. s264-s264
Author(s):  
V. I. Monin ◽  
J. T. Assis ◽  
S. M. Iglesias
Keyword(s):  
Stress Distribution ◽  
Fourier Analysis ◽  
Surface Stress ◽  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Stress Gradients

X-ray diffraction characterization of microstrain in some uranium alloys

1998 ◽  
Vol 13 (2) ◽  
pp. 89-95
Author(s):  
G. Kimmel ◽  
D. Dayan
Keyword(s):  
Thermal Stresses ◽  
Cold Work ◽  
Solubility Limit ◽  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Semiquantitative Method

Taking advantage of the feasibility to obtain well-prepared surfaces, an extensive work has been done in studying X-ray diffraction line broadening effects from flat polycrystalline samples of uranium and uranium alloys. The broadening analysis has been used as a semiquantitative method for measuring inhomogeneity of alloying, hardness, and residual thermal stresses. Good correlation between the microstrain and the hardness was found after heat treatments and cold work. A comparable correlation was found between the microstrain in the supersaturated α-uranium phase quenched from the γ region, and the concentration of the alloying elements. The measured microstrain in the supersaturated α-uranium phase was used as a quantitative value for determination of the solubility limit of Ta and W in γ-uranium. As a result of this study it was found that the limit of solubility is approximately 2.6 and 2.0 at. % for Ta and W, respectively.

Formalism for the determination of intermediate stress gradients using X-ray diffraction

2009 ◽  
Vol 42 (2) ◽  
pp. 192-197 ◽  
Author(s):  
Thomas Gnäupel-Herold
Keyword(s):  
Lattice Strain ◽  
Narrow Line ◽  
X Ray Diffraction ◽  
Beam Spot ◽  
Strain Measurements ◽  
One Dimensional ◽  
X Ray ◽  
Stress Gradients ◽  
Shaped Beam

A method is outlined that allows the determination of one-dimensional stress gradients at length scales greater than 0.2 mm. By using standard four-circle X-ray diffractometer equipment and simple aperture components, length resolutions down to 0.05 mm in one direction can be achieved through constant orientation of a narrow, line-shaped beam spot. Angle calculations are given for the adjustment of goniometer angles, and for the effective azimuth and tilt of the scattering vector for general angle settings in a four-circle goniometer. The latter is necessary for the computation of stresses from lattice strain measurements.

The Use of the Pseudo-Voigt Function in the Variance Method of X-ray Line-Broadening Analysis

1997 ◽  
Vol 30 (4) ◽  
pp. 427-430 ◽  
Author(s):  
F. Sánchez-Bajo ◽  
F. L. Cumbrera
Keyword(s):  
Crystallite Size ◽  
Original Form ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Variance Method ◽  
The Mean ◽  
Voigt Function

A modified application of the variance method, using the pseudo-Voigt function as a good approximation to the X-ray diffraction profiles, is proposed in order to obtain microstructural quantities such as the mean crystallite size and root-mean-square (r.m.s.) strain. Whereas the variance method in its original form is applicable only to well separated reflections, this technique can be employed in the cases where there is line-profile overlap. Determination of the mean crystallite size and r.m.s. strain for several crystallographic directions in a nanocrystalline cubic sample of 9-YSZ (yttria-stabilized zirconia) has been performed by means of this procedure.

X-ray diffraction line broadening on vibrating dry-milled Two Crows sepiolite

2006 ◽  
Vol 54 (3) ◽  
pp. 390-401 ◽  
Author(s):  
Joaquin Bastida ◽  
Marek A. Kojdecki ◽  
Pablo Pardo ◽  
Pedro Amorós
Keyword(s):  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray
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