scholarly journals Evidence of a symmetric disordered ice above ~62 GPa from Raman scattering and X-ray diffraction investigations

1996 ◽  
Vol 52 (a1) ◽  
pp. C535-C535
Author(s):  
E. Wolanin ◽  
Ph. Pruzan ◽  
M. Gauthier ◽  
J. C. Chervin ◽  
B. Canny ◽  
...  
Keyword(s):  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Exploring the fundamental effects of deposition time on the microstructure of graphene nanoflakes by Raman scattering and X-ray diffraction

CrystEngComm ◽  
2011 ◽  
Vol 13 (1) ◽  
pp. 312-318 ◽  
Author(s):  
Navneet Soin ◽  
Susanta Sinha Roy ◽  
Christopher O'Kane ◽  
James A. D. McLaughlin ◽  
Teck H. Lim ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Deposition Time ◽  
X Ray Diffraction ◽  
X Ray ◽  
Graphene Nanoflakes

High-pressure effect on inverse spinel LiCuVO4: X-ray diffraction and Raman scattering

2013 ◽  
Vol 22 (1) ◽  
pp. 016103 ◽  
Author(s):  
Heng-Nan Liang ◽  
Chun-Li Ma ◽  
Fei Du ◽  
Qi-Liang Cui ◽  
Guang-Tian Zou
Keyword(s):  
High Pressure ◽  
Raman Scattering ◽  
Pressure Effect ◽  
X Ray Diffraction ◽  
Inverse Spinel ◽  
X Ray ◽  
High Pressure Effect

Non-uniform distribution of dopant iron ions in TiO2 nanocrystals probed by X-ray diffraction, Raman scattering, photoluminescence and photocatalysis

2015 ◽  
Vol 3 (8) ◽  
pp. 1846-1853 ◽  
Author(s):  
S. Manu ◽  
M. Abdul Khadar
Keyword(s):  
Raman Scattering ◽  
Uniform Distribution ◽  
Semiconductor Nanocrystals ◽  
Iron Ions ◽  
X Ray Diffraction ◽  
Tio2 Nanocrystals ◽  
X Ray ◽  
Practical Applications ◽  
Mechanism Operative

The phenomenon of ‘self-purification’ is a real mechanism operative in nanocrystals and this should be taken into account while doping semiconductor nanocrystals with external impurities for practical applications.

High pressure studies of Ni3[(C2H5N5)6(H2O)6](NO3)6·1.5H2O by Raman scattering, IR absorption, and synchrotron X-ray diffraction

RSC Advances ◽  
2016 ◽  
Vol 6 (69) ◽  
pp. 65031-65037 ◽  
Author(s):  
Junru Jiang ◽  
Jianguo Zhang ◽  
Peifen Zhu ◽  
Jianfu Li ◽  
Xiaoli Wang ◽  
...  
Keyword(s):  
Molecular Structure ◽  
High Pressure ◽  
Raman Scattering ◽  
Ir Absorption ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Pressure Studies

Molecular structure (a) and packing diagram (b) of 1. The green, grey, blue, red, and white spheres denote Ni, C, N, O, and H atoms, respectively.

SnO films and their oxidation to SnO2: Raman scattering, IR reflectivity and X-ray diffraction studies

1984 ◽  
Vol 121 (3) ◽  
pp. 217-225 ◽  
Author(s):  
J. Geurts ◽  
S. Rau ◽  
W. Richter ◽  
F.J. Schmitte
Keyword(s):  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray

Phase Characterization and Grain Size Effects of Nanophase Y2O3, ZrO2 and Y2O3-ZrO2 Composites Produced by the Gas-Phase Condensation Technique

1992 ◽  
Vol 286 ◽  
Author(s):  
C. M. Foster ◽  
G. R. Bai ◽  
J. C. Parker ◽  
M. N. Ali
Keyword(s):  
Grain Size ◽  
Raman Scattering ◽  
Gas Phase ◽  
Size Effects ◽  
Structural Evolution ◽  
Deposition Process ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanophase Materials ◽  
Phase Characterization

ABSTRACTNanophase (n-) ZrO2 was produced in its pure and partially stabilized form by the gas-phase condensation method. The material was examined by x-ray diffraction and Raman scattering to obtain information on the structural evolution of the material during sintering. Two types of Y2O3 doped ZrO2 nanophase materials were made one by co-deposition of n-Y2O3 and n-ZrO2 in a consecutive manner and the second by mechanically mixing n-Y2O3 and n-ZrO2. We have determined that the co-deposition process is the most effect means of doping the n-ZrO2.

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