XAFS and X-MCD spectroscopies with undulator gap scan

1998 ◽  
Vol 5 (3) ◽  
pp. 989-991 ◽  
Author(s):  
Andrei Rogalev ◽  
Vincent Gotte ◽  
Jose´ Goulon ◽  
Christophe Gauthier ◽  
Joel Chavanne ◽  
...  
Keyword(s):  
Energy Range ◽  
Absorption Spectroscopy ◽  
Emission Peak ◽  
Photon Statistics ◽  
Wide Energy Range ◽  
X Ray ◽  
Polarization Rate ◽  
Spin Polarized ◽  
Wide Energy ◽  
X Ray Absorption

The first experimental applications of the undulator gap-scan technique in X-ray absorption spectroscopy are reported. The key advantage of this method is that during EXAFS scans the undulator is permanently tuned to the maximum of its emission peak in order to maximize the photon statistics. In X-MCD or spin-polarized EXAFS studies with a helical undulator of the Helios type, the polarization rate can also be kept almost constant over a wide energy range.

Photon interference effect in x-ray absorption spectra over a wide energy range

2002 ◽  
Vol 66 (11) ◽  
Author(s):  
Y. Nishino ◽  
T. Ishikawa ◽  
M. Suzuki ◽  
N. Kawamura ◽  
P. Kappen ◽  
...  
Keyword(s):  
Energy Range ◽  
Absorption Spectra ◽  
Interference Effect ◽  
Wide Energy Range ◽  
X Ray ◽  
Wide Energy ◽  
X Ray Absorption

Design of an ultrahigh-energy-resolution and wide-energy-range soft X-ray beamline

2013 ◽  
Vol 21 (1) ◽  
pp. 273-279 ◽  
Author(s):  
L. Xue ◽  
R. Reininger ◽  
Y.-Q. Wu ◽  
Y. Zou ◽  
Z.-M. Xu ◽  
...  
Keyword(s):  
Energy Range ◽  
Energy Resolution ◽  
Wide Energy Range ◽  
Ultrahigh Energy ◽  
Exit Slit ◽  
Shanghai Synchrotron Radiation Facility ◽  
X Ray ◽  
Variable Line ◽  
Line Spacing ◽  
Wide Energy

A new ultrahigh-energy-resolution and wide-energy-range soft X-ray beamline has been designed and is under construction at the Shanghai Synchrotron Radiation Facility. The beamline has two branches: one dedicated to angle-resolved photoemission spectroscopy (ARPES) and the other to photoelectron emission microscopy (PEEM). The two branches share the same plane-grating monochromator, which is equipped with four variable-line-spacing gratings and covers the 20–2000 eV energy range. Two elliptically polarized undulators are employed to provide photons with variable polarization, linear in every inclination and circular. The expected energy resolution is approximately 10 meV at 1000 eV with a flux of more than 3 × 1010 photons s−1at the ARPES sample positions. The refocusing of both branches is based on Kirkpatrick–Baez pairs. The expected spot sizes when using a 10 µm exit slit are 15 µm × 5 µm (horizontal × vertical FWHM) at the ARPES station and 10 µm × 5 µm (horizontal × vertical FWHM) at the PEEM station. The use of plane optical elements upstream of the exit slit, a variable-line-spacing grating and a pre-mirror in the monochromator that allows the influence of the thermal deformation to be eliminated are essential for achieving the ultrahigh-energy resolution.

scholarly journals Droplet-based in situ X-ray absorption spectroscopy cell for studying crystallization processes at the tender X-ray energy range

RSC Advances ◽  
2019 ◽  
Vol 9 (58) ◽  
pp. 34004-34010 ◽  
Author(s):  
Jacinta Xto ◽  
Reto Wetter ◽  
Camelia N. Borca ◽  
Christophe Frieh ◽  
Jeroen A. van Bokhoven ◽  
...  
Keyword(s):  
Energy Range ◽  
Absorption Spectroscopy ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Absorption

We introduce a new in situ cell for time-resolved reactions involving aerosols/droplets using tender X-ray absorption spectroscopy and related methods.

Nanoscale determination of interatomic distance by ptychography-EXAFS method using advanced Kirkpatrick–Baez mirror focusing optics

2020 ◽  
Vol 27 (2) ◽  
pp. 455-461
Author(s):  
Makoto Hirose ◽  
Kei Shimomura ◽  
Takaya Higashino ◽  
Nozomu Ishiguro ◽  
Yukio Takahashi
Keyword(s):  
Wide Energy Range ◽  
X Rays ◽  
Bulk Materials ◽  
Interatomic Distances ◽  
X Ray ◽  
Combination Technique ◽  
Wide Energy ◽  
Diffraction Patterns ◽  
X Ray Absorption

This work demonstrates a combination technique of X-ray ptychography and the extended X-ray absorption fine structure (ptychography-EXAFS) method, which can determine the interatomic distances of bulk materials at the nanoscale. In the high-resolution ptychography-EXAFS method, it is necessary to use high-intense coherent X-rays with a uniform wavefront in a wide energy range, hence a ptychographic measurement system installed with advanced Kirkpatrick–Baez mirror focusing optics is developed and its performance is evaluated. Ptychographic diffraction patterns of micrometre-size MnO particles are collected by using this system at 139 energies between 6.504 keV and 7.114 keV including the Mn K absorption edge, and then the EXAFS of MnO is derived from the reconstructed images. By analyzing the EXAFS spectra obtained from a 48 nm × 48 nm region, the nanoscale bond lengths of the first and second coordination shells of MnO are determined. The present approach has great potential to elucidate the unclarified relationship among the morphology, electronic state and atomic arrangement of inhomogeneous bulk materials with high spatial resolution.

Reducing the thermal deformation of InSb crystal by using double-bounce HHRMs in the TPS tender X-ray absorption spectroscopy beamline

2021 ◽  
Vol 28 (4) ◽  
Author(s):  
Din-Goa Liu ◽  
Ming-Han Lee ◽  
Ying-Jui Lu ◽  
Jyh-Fu Lee ◽  
Chi-Liang Chen
Keyword(s):  
Energy Range ◽  
Photon Energy ◽  
Absorption Spectroscopy ◽  
Thermal Load ◽  
Incident Angle ◽  
Silicon Surfaces ◽  
Photon Energy Range ◽  
Double Crystal ◽  
X Ray ◽  
X Ray Absorption

The Taiwan Photon Source (TPS) with high brightness and energy tunability is suitable for applications in spectroscopy. The tender X-ray absorption beamline will be optimized for X-ray absorption spectroscopy measurements using a bending-magnet source in a unique photon energy range (1.7–10 keV) and two crystal pairs [InSb(111) and Si(111)] separated using back-to-back double-crystal monochromators (DCMs). InSb crystals are typically used in the lower photon energy range of 1.7–3.5 keV. However, the poor thermal conductivity of InSb crystals leads to severe deformation. This factor should be considered when the monochromator is installed on a tender X-ray beamline in a storage ring with a high power density. There are many approaches to reducing the thermal load on the first crystal of a DCM. Double-bounce high harmonics rejection mirrors in front of the DCM serve not only to reduce the high-order harmonics but also to absorb considerable quantities of heat. Two coating stripes on the silicon surfaces with a variable incident angle will be key to solving the thermal load on this beamline.

Large-Area X-ray Lithography System for LIGA Process Operating in Wide Energy Range of Synchrotron Radiation

2005 ◽  
Vol 44 (7B) ◽  
pp. 5500-5504 ◽  
Author(s):  
Yuichi Utsumi ◽  
Takefumi Kishimoto ◽  
Tadashi Hattori ◽  
Hirotsugu Hara
Keyword(s):  
Synchrotron Radiation ◽  
Energy Range ◽  
Wide Energy Range ◽  
Large Area ◽  
X Ray ◽  
Wide Energy ◽  
Area X ◽  
Lithography System

scholarly journals X-ray Variability of Blazars

2002 ◽  
Vol 19 (1) ◽  
pp. 49-54 ◽  
Author(s):  
Elena Pian
Keyword(s):  
Energy Range ◽  
High Energy ◽  
Space Missions ◽  
Present Review ◽  
Wide Energy Range ◽  
Spectral Variability ◽  
X Ray ◽  
Energy Emission ◽  
Wide Energy ◽  
High Energy Emission

AbstractCritical progress in our understanding of high energy emission from AGN has been determined in the last 10 years by X-ray monitoring campaigns with many space missions, notably ROSAT, ASCA, RXTE, BeppoSAX, and XMM, often in conjunction with observations at other frequencies. The emphasis of the present review is on recent findings about X-ray variability of blazars. Among AGN, these exhibit the largest amplitude variations of the X-ray emission, often well correlated with variations at higher energies (GeV and TeV radiation). The accurate sampling of the X-ray spectra over more than three decades in energy, made possible by the wide energy range of BeppoSAX, has also shown strong spectral variability in blazar active states, suggesting extreme electron energies and leading to the identification of a class of ‘extreme synchrotron’ sources.

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