First performance assessment of the small-angle X-ray scattering beamline at ELETTRA

1998 ◽  
Vol 5 (3) ◽  
pp. 506-508 ◽  
Author(s):  
H. Amenitsch ◽  
M. Rappolt ◽  
M. Kriechbaum ◽  
H. Mio ◽  
P. Laggner ◽  
...  
Keyword(s):  
Small Angle ◽  
Wide Angle ◽  
Fibrous Materials ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Scattering Measurements ◽  
Double Focusing ◽  
Ray Scattering

The double-focusing high-flux wiggler beamline dedicated to small-angle X-ray scattering (SAXS) and wide-angle X-ray scattering (WAXS) at ELETTRA has gone into user operation recently. It has been designed specifically for time-resolved studies of non-crystalline and fibrous materials in the submillisecond time scale, and has been optimized for small-angle scattering measurements. An overview of the beamline status and of some representative results, highlighting the performance of the SAXS beamline, are given.

Performance and First Results of the ELETTRA High-Flux Beamline for Small-Angle X-ray Scattering

1997 ◽  
Vol 30 (5) ◽  
pp. 872-876 ◽  
Author(s):  
H. Amenitsch ◽  
S. Bernstorff ◽  
M. Kriechbaum ◽  
D. Lombardo ◽  
H. Mio ◽  
...  
Keyword(s):  
Small Angle ◽  
Small Angle Scattering ◽  
Design Parameters ◽  
High Flux ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

A new beamline for small-angle X-ray scattering (SAXS) has recently been constructed and is presently under final commissioning at the 2 GeV storage ring ELETTRA. It has been designed specifically for time-resolved studies of non-crystalline and fibrous materials and has been optimized for small-angle scattering measurements. The beamline operates with a SAXS resolution between 10 and about 1400 Å in d spacing (at 8 keV) and has been optimized with respect to high flux at the sample [of the order of 1013 photons s−1 for 8 keV photons (2 GeV, 400 mA)]. Soon it will be possible to perform simultaneously wide-angle diffraction measurements in the d-spacing range 1.2–8 Å (at 8 keV). In order to allow time-resolved (resolution ~1 ms) small-angle scattering measurements, a high-power 57-pole wiggler is used as the beamline source. From its beam, one of three discrete energies, 5.4, 8 and 16 keV, can be selected with a double-crystal monochromator, which contains three pairs of asymmetrically cut plane Si(111) crystals. Downstream, the beam is focused horizontally and vertically by a toroidal mirror. Commissioning tests of this new SAXS beamline showed that all design parameters have been realized.

Time-resolved isothermal crystallization of absorbable PGA-co-PLA copolymer by synchrotron small-angle X-ray scattering and wide-angle X-ray diffraction

Polymer ◽  
2001 ◽  
Vol 42 (21) ◽  
pp. 8965-8973 ◽  
Author(s):  
Zhi-Gang Wang ◽  
Xuehui Wang ◽  
Benjamin S. Hsiao ◽  
Saša Andjelić ◽  
Dennis Jamiolkowski ◽  
...  
Keyword(s):  
Small Angle ◽  
Isothermal Crystallization ◽  
Wide Angle ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Time-resolved small-angle x-ray scattering measurements of a polymer bicontinuous microemulsion structure factor under shear

2002 ◽  
Vol 66 (4) ◽  
Author(s):  
Franklin E. Caputo ◽  
Wesley R. Burghardt ◽  
Kasiraman Krishnan ◽  
Frank S. Bates ◽  
Timothy P. Lodge
Keyword(s):  
Small Angle ◽  
Structure Factor ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Bicontinuous Microemulsion ◽  
Scattering Measurements ◽  
Ray Scattering

scholarly journals Versatile wide angle diffraction setup for simultaneous wide and small angle x-ray scattering measurements with synchrotron radiation

2006 ◽  
Vol 77 (3) ◽  
pp. 033904 ◽  
Author(s):  
D. R. Rueda ◽  
M. C. García-Gutiérrez ◽  
A. Nogales ◽  
M. J. Capitán ◽  
T. A. Ezquerra ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Small Angle ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

Fast Nucleation and Growth of ZIF-8 Nanocrystals Monitored by Time-Resolved In Situ Small-Angle and Wide-Angle X-Ray Scattering

2011 ◽  
Vol 123 (35) ◽  
pp. 8217-8221 ◽  
Author(s):  
Janosch Cravillon ◽  
Christian A. Schröder ◽  
Roman Nayuk ◽  
Jeremie Gummel ◽  
Klaus Huber ◽  
...  
Keyword(s):  
Small Angle ◽  
Nucleation And Growth ◽  
Wide Angle ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Fast Nucleation and Growth of ZIF-8 Nanocrystals Monitored by Time-Resolved In Situ Small-Angle and Wide-Angle X-Ray Scattering

2011 ◽  
Vol 50 (35) ◽  
pp. 8067-8071 ◽  
Author(s):  
Janosch Cravillon ◽  
Christian A. Schröder ◽  
Roman Nayuk ◽  
Jeremie Gummel ◽  
Klaus Huber ◽  
...  
Keyword(s):  
Small Angle ◽  
Nucleation And Growth ◽  
Wide Angle ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Correlation of nanostructural parameters and macromechanical behaviour of hyperbranched-modified polypropylene using time-resolved small-angle X-ray scattering measurements

2012 ◽  
Vol 62 (7) ◽  
pp. 1101-1111 ◽  
Author(s):  
Morteza Ganjaee Sari ◽  
Norbert Stribeck ◽  
Siamak Moradian ◽  
Ahmad Zeinolebadi ◽  
Saeed Bastani ◽  
...  
Keyword(s):  
Small Angle ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

Small-Angle X-ray Scattering at the ESRF High-Brilliance Beamline

1997 ◽  
Vol 30 (5) ◽  
pp. 867-871 ◽  
Author(s):  
P. Bösecke ◽  
O. Diat
Keyword(s):  
Small Angle ◽  
Small Angle Scattering ◽  
Optical Systems ◽  
Photon Flux ◽  
X Rays ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Ray Scattering

The high-brilliance beamline (BL4/ID2) at the European Synchrotron Radiation Facility (ESRF) in Grenoble has been constructed with the emphasis on time-resolved small-angle X-ray scattering and macromolecular crystallography. It has been open to users for two years. The beamline has opened up new areas in small-angle scattering research, facilitating (a) small-angle crystallography on structures with unit cells of several hundredths of nanometres, (b) overlap with the light scattering range for the study of optical systems, (c) high photon flux for time-resolved experiments and (d) a high spatial coherence allowing submicrometre imaging with X-rays. The set-up and the detector system of the small-angle scattering station are presented. A method for obtaining absolute scattering intensities is described. The parasitic background at the station is discussed in terms of absolute scattering intensities.

A Wide-Bandpass Multilayer Monochromator for Biological Small-Angle Scattering and Fiber Diffraction Studies

1998 ◽  
Vol 31 (5) ◽  
pp. 672-682 ◽  
Author(s):  
Hiro Tsuruta ◽  
Sean Brennan ◽  
Zofia U. Rek ◽  
Thomas C. Irving ◽  
W. H. Tompkins ◽  
...  
Keyword(s):  
Small Angle ◽  
Double Crystal ◽  
Time Resolved ◽  
X Ray ◽  
Double Crystal Monochromator ◽  
X Ray Scattering ◽  
Fiber Diffraction ◽  
Angle Scattering ◽  
Flux Level ◽  
Ray Scattering

Many biological applications of small-angle X-ray scattering, in particular time-resolved studies, are often limited by the flux incident on the sample due to the smaller scattering cross section of biological specimens. The wider-energy bandpass of a monochromator that consists of a pair of synthetic multilayer microstructures can, in principle, provide a flux two orders of magnitude higher than that of an Si(111) double-crystal monochromator. Two types of multilayers have been installed in the standard monochromator tank of beamline 4-2 at the Stanford Synchrotron Radiation Laboratory; the multilayer beam has been characterized for studies of small-angle X-ray scattering/diffraction from biological materials. Reflectivity and topography measurements indicate that the multilayers are quite adequate for these applications and a pair of Mo/B4C multilayers provided a 10–30 times increase in flux, compared with the flux level obtained with an Si(111) double-crystal monochromator. The increased flux level is very useful in time-resolved scattering studies as well as for recording weak scattering at higher angles. Having carried out many solution scattering and fiber diffraction experiments, we conclude that the use of multilayer does not result in significant broadening of diffraction peaks nor does it have appreciable effects on small-angle resolution. No significant increase in background is observed.

Sign in / Sign up

Export Citation Format

Share Document