scholarly journals Detailed surface analysis of V-defects in GaN films on patterned silicon(111) substrates by metal–organic chemical vapour deposition. Corrigendum

2020 ◽  
Vol 53 (1) ◽  
pp. 302-302
Author(s):  
Jiang-Dong Gao ◽  
Jian-Li Zhang ◽  
Xin Zhu ◽  
Xiao-Ming Wu ◽  
Chun-Lan Mo ◽  
...  

An error in the article by Gao, Zhang, Zhu, Wu, Mo, Pan, Liu & Jiang [J. Appl. Cryst. (2019), 52, 637–642] is corrected.

1993 ◽  
Vol 3 (7) ◽  
pp. 739-742 ◽  
Author(s):  
Paul O'Brien ◽  
John R. Walsh ◽  
Anthony C. Jones ◽  
Simon A. Rushworth ◽  
Clive Meaton

1995 ◽  
Vol 14 (2) ◽  
pp. 57-66 ◽  
Author(s):  
V.A.C. Haanappel, ◽  
J.B.Α. Scharenborg, ◽  
H.D. van Corbach, ◽  
T. Fransen, ◽  
P.J. Gellings,

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