Detailed surface analysis of V-defects in GaN films on patterned silicon(111) substrates by metal–organic chemical vapour deposition. Corrigendum
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An error in the article by Gao, Zhang, Zhu, Wu, Mo, Pan, Liu & Jiang [J. Appl. Cryst. (2019), 52, 637–642] is corrected.
2011 ◽
Vol 11
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pp. 8294-8301
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1992 ◽
Vol 14
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pp. 43-45
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2010 ◽
Vol 43
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pp. 145402
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1993 ◽
Vol 3
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pp. 739-742
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2003 ◽
Vol 20
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pp. 1960-1962
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1995 ◽
Vol 14
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pp. 57-66
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