scholarly journals A UHV MOKE magnetometer complementing XMCD-PEEM at the Elettra Synchrotron

2021 ◽  
Vol 28 (3) ◽  
Author(s):  
Francesca Genuzio ◽  
Tomasz Giela ◽  
Matteo Lucian ◽  
Tevfik Onur Menteş ◽  
Carlo Alberto Brondin ◽  
...  
Keyword(s):  
Kerr Effect ◽  
Magnetic Circular Dichroism ◽  
X Ray ◽  
Photoelastic Modulator ◽  
X Ray Imaging ◽  
Manipulation System ◽  
Magneto Optical Kerr Effect ◽  
Imaging And Spectroscopy ◽  
Photoemission Electron

We report on a custom-built UHV-compatible Magneto-Optical Kerr Effect (MOKE) magnetometer for applications in surface and materials sciences, operating in tandem with the PhotoEmission Electron Microscope (PEEM) endstation at the Nanospectroscopy beamline of the Elettra synchrotron. The magnetometer features a liquid-nitrogen-cooled electromagnet that is fully compatible with UHV operation and produces magnetic fields up to about 140 mT at the sample. Longitudinal and polar MOKE measurement geometries are realized. The magneto-optical detection is based on polarization analysis using a photoelastic modulator. The sample manipulation system is fully compatible with that of the PEEM, making it possible to exchange samples with the beamline endstation, where complementary X-ray imaging and spectroscopy techniques are available. The magnetometer performance is illustrated by experiments on cobalt ultra-thin films, demonstrating close to monolayer sensitivity. The advantages of combining in situ growth, X-ray Magnetic Circular Dichroism imaging (XMCD-PEEM) and MOKE magnetometry into a versatile multitechnique facility are highlighted.

A scanning reflection X-ray microscope for magnetic imaging in the EUV range

2019 ◽  
Vol 26 (6) ◽  
pp. 2040-2049
Author(s):  
Andreas Schümmer ◽  
H.-Ch. Mertins ◽  
Claus Michael Schneider ◽  
Roman Adam ◽  
Stefan Trellenkamp ◽  
...  
Keyword(s):  
Kerr Effect ◽  
Magnetic Circular Dichroism ◽  
Thin Foil ◽  
Light Sources ◽  
Magnetic Domains ◽  
X Ray ◽  
Magnetic Imaging ◽  
Magnetic Dichroism ◽  
Magneto Optical Kerr Effect ◽  
Microscope Design

The mechanical setup of a novel scanning reflection X-ray microscope is presented. It is based on zone plate optics optimized for reflection mode in the EUV spectral range. The microscope can operate at synchrotron radiation beamlines as well as at laboratory-based plasma light sources. In contrast to established X-ray transmission microscopes that use thin foil samples, the new microscope design presented here allows the investigation of any type of bulk materials. Importantly, this permits the investigation of magnetic materials by employing experimental techniques based on X-ray magnetic circular dichroism, X-ray linear magnetic dichroism or the transversal magneto-optical Kerr effect (T-MOKE). The reliable functionality of the new microscope design has been demonstrated by T-MOKE microscopy spectra of Fe/Cr-wedge/Fe trilayer samples. The spectra were recorded at various photon energies across the Fe 3p edge revealing the orientation of magnetic domains in the sample.

scholarly journals Soft X-RAY Magnetic Scattering Study of thin Films and Multilayers

1991 ◽  
Vol 231 ◽  
Author(s):  
C.-C. Kao ◽  
E.D. Johnson ◽  
J.B. Hastings ◽  
D.P. Siddons ◽  
C. Vettier
Keyword(s):  
Kerr Effect ◽  
Faraday Effect ◽  
Magnetic Circular Dichroism ◽  
Magnetic Scattering ◽  
Optical Kerr Effect ◽  
Scattering Process ◽  
Resonant Enhancement ◽  
X Ray ◽  
Scattering Study ◽  
Magneto Optical Kerr Effect

AbstractA brief discussion of the resonant magnetic scattering process is given. Results from recent studies of thin Fe films and Fe/Gd multilayers are used as examples to demonstrate the information can be obtained and the unique features of this technique: large resonant enhancement, sensitivity to magnitization, elemental specificity, and tunability of the penetration depth. Comparison is made with related techniques: magneto-optical Kerr effect, Faraday effect, and magnetic circular dichroism.

scholarly journals A novel experimental setup for in situ optical and X-ray imaging of laser sintering of polymer particles

2019 ◽  
Vol 90 (8) ◽  
pp. 083905 ◽  
Author(s):  
Prakhyat Hejmady ◽  
Lucien C. Cleven ◽  
Lambèrt C. A. van Breemen ◽  
Patrick D. Anderson ◽  
Ruth Cardinaels
Keyword(s):  
Laser Sintering ◽  
Experimental Setup ◽  
Polymer Particles ◽  
X Ray ◽  
X Ray Imaging

X-ray imaging and spectroscopy of nitrogen in the SiO2/SiC interface of the 4H–SiC MOSFET trench sidewalls

2020 ◽  
Vol 13 (7) ◽  
pp. 071005
Author(s):  
Noritake Isomura ◽  
Kousuke Kitazumi ◽  
Keita Kataoka ◽  
Katsuhiro Kutsuki ◽  
Yukihiko Watanabe
Keyword(s):  
X Ray ◽  
X Ray Imaging ◽  
Imaging And Spectroscopy

In Situ Magnetic-Circular-X-Ray-Dichroism Measurements: An Epitaxial Fe Wedge on Cu(100)

MRS Bulletin ◽  
1999 ◽  
Vol 24 (1) ◽  
pp. 41-45 ◽  
Author(s):  
M.E. Dávila ◽  
D. Arvanitis ◽  
J. Hunter Dunn ◽  
N. Mårtensson ◽  
P. Srivastava ◽  
...  
Keyword(s):  
Ultrathin Films ◽  
Magnetic Circular Dichroism ◽  
Polarized Light ◽  
Measured Quantity ◽  
Easy Magnetization ◽  
Magnetization Direction ◽  
Core Electron ◽  
Circularly Polarized ◽  
X Ray

Circularly polarized x-ray radiation is attracting increasing interest as a tool for the characterization of the electronic, magnetic, and chiral properties of low-dimensional structures. Using circular light (with electric field vector parallel to the orbital plane), a dependence of the measured quantity by changing either the orientation of the light polarization or the magnetization is indicative of the existence of magnetic circular dichroism. It can be observed in x-ray absorption spectroscopy (XAS), in which the photon energy is scanned through an absorption threshold exciting a core electron into an unoccupied valence state using circularly polarized light. Synchrotron radiation sources have made this technique possible. It can also be observed in photo-emission spectroscopy from core and valence levels. Here we focus on magnetic circular x-ray dichroism (MCXD) in XAS as an element-specific tool to investigate magnetic properties of ultrathin films in situ. The application of magneto-optical sum rules enables the determination of the orbital and spin magnetic moments per atom from XAS spectra, as well as the easy magnetization direction.MCXD-based magnetometry in XAS is extensively used by measuring the L absorption edges of 3d-transition metals, where large intensity changes (up to 60%) of the L-edge white lines are observed upon reversal of either the sample magnetization or the light helicity. The high magnetic contrast obtained, combined with the elemental specificity of the technique, allows for the study of very dilute samples such as ultrathin films. We first concentrate on the selection rules governing MCXD in XAS.

Multipixel characterization of imaging CZT detectors for hard x-ray imaging and spectroscopy

2004 ◽  
Author(s):  
Santosh V. Vadawale ◽  
Jae Sub Hong ◽  
Jonathan E. Grindlay ◽  
Peter Williams ◽  
Minhua Zhang ◽  
...  
Keyword(s):  
X Ray ◽  
X Ray Imaging ◽  
Imaging And Spectroscopy ◽  
Czt Detectors
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