scholarly journals Soft X-RAY Magnetic Scattering Study of thin Films and Multilayers

1991 ◽  
Vol 231 ◽  
Author(s):  
C.-C. Kao ◽  
E.D. Johnson ◽  
J.B. Hastings ◽  
D.P. Siddons ◽  
C. Vettier

AbstractA brief discussion of the resonant magnetic scattering process is given. Results from recent studies of thin Fe films and Fe/Gd multilayers are used as examples to demonstrate the information can be obtained and the unique features of this technique: large resonant enhancement, sensitivity to magnitization, elemental specificity, and tunability of the penetration depth. Comparison is made with related techniques: magneto-optical Kerr effect, Faraday effect, and magnetic circular dichroism.

2019 ◽  
Vol 26 (6) ◽  
pp. 2040-2049
Author(s):  
Andreas Schümmer ◽  
H.-Ch. Mertins ◽  
Claus Michael Schneider ◽  
Roman Adam ◽  
Stefan Trellenkamp ◽  
...  

The mechanical setup of a novel scanning reflection X-ray microscope is presented. It is based on zone plate optics optimized for reflection mode in the EUV spectral range. The microscope can operate at synchrotron radiation beamlines as well as at laboratory-based plasma light sources. In contrast to established X-ray transmission microscopes that use thin foil samples, the new microscope design presented here allows the investigation of any type of bulk materials. Importantly, this permits the investigation of magnetic materials by employing experimental techniques based on X-ray magnetic circular dichroism, X-ray linear magnetic dichroism or the transversal magneto-optical Kerr effect (T-MOKE). The reliable functionality of the new microscope design has been demonstrated by T-MOKE microscopy spectra of Fe/Cr-wedge/Fe trilayer samples. The spectra were recorded at various photon energies across the Fe 3p edge revealing the orientation of magnetic domains in the sample.


2020 ◽  
Vol 14 (11) ◽  
pp. 2000177
Author(s):  
Pramod Vishwakarma ◽  
Mukul Gupta ◽  
Varimalla R. Reddy ◽  
Deodatta M. Phase ◽  
Ajay Gupta

2018 ◽  
Vol 57 (9S2) ◽  
pp. 09TD02 ◽  
Author(s):  
Shingo Yamamoto ◽  
Yuya Kubota ◽  
Kohei Yamamoto ◽  
Yoshinobu Takahashi ◽  
Kohei Maruyama ◽  
...  

2002 ◽  
Vol 09 (02) ◽  
pp. 913-919 ◽  
Author(s):  
V. SENZ ◽  
A. KLEIBERT ◽  
J. BANSMANN

The transverse magneto-optical Kerr effect (T-MOKE) in the soft X-ray regime is used to investigate the magnetic properties of ultrathin epitaxial Fe(110) films and thermally created epitaxial Fe islands on W(110). The measurements have been carried out at the Fe 2p core levels with tunable, linearly polarized synchrotron radiation. Besides the chemical selectivity T-MOKE at core levels is characterized by a much larger sensitivity compared to the visible regime. We have analyzed the transition from thin films to a three-dimensional island system at a thickness of 4 ML and the magnetic behavior when increasing the iron coverage to 8 ML. The Fe island system is characterized by a rotation of the easy magnetization axis in this coverage regime.


2021 ◽  
Vol 28 (3) ◽  
Author(s):  
Francesca Genuzio ◽  
Tomasz Giela ◽  
Matteo Lucian ◽  
Tevfik Onur Menteş ◽  
Carlo Alberto Brondin ◽  
...  

We report on a custom-built UHV-compatible Magneto-Optical Kerr Effect (MOKE) magnetometer for applications in surface and materials sciences, operating in tandem with the PhotoEmission Electron Microscope (PEEM) endstation at the Nanospectroscopy beamline of the Elettra synchrotron. The magnetometer features a liquid-nitrogen-cooled electromagnet that is fully compatible with UHV operation and produces magnetic fields up to about 140 mT at the sample. Longitudinal and polar MOKE measurement geometries are realized. The magneto-optical detection is based on polarization analysis using a photoelastic modulator. The sample manipulation system is fully compatible with that of the PEEM, making it possible to exchange samples with the beamline endstation, where complementary X-ray imaging and spectroscopy techniques are available. The magnetometer performance is illustrated by experiments on cobalt ultra-thin films, demonstrating close to monolayer sensitivity. The advantages of combining in situ growth, X-ray Magnetic Circular Dichroism imaging (XMCD-PEEM) and MOKE magnetometry into a versatile multitechnique facility are highlighted.


2003 ◽  
Vol 93 (10) ◽  
pp. 6516-6518 ◽  
Author(s):  
M. Hecker ◽  
H.-C. Mertins ◽  
D. Abramsohn ◽  
W. Gudat ◽  
C. M. Schneider

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