scholarly journals Hybrid photon-counting detectors accelerating synchrotron and laboratory science

2014 ◽  
Vol 70 (a1) ◽  
pp. C692-C692
Author(s):  
Clemens Schulze-Briese
Keyword(s):  
Data Quality ◽  
Data Acquisition ◽  
High Throughput ◽  
Single Photon ◽  
Photon Counting ◽  
X Rays ◽  
Time Data ◽  
Single Photon Counting ◽  
X Ray ◽  
Pixel Detectors

Since their introduction in 2007, single-photon-counting PILATUS hybrid pixel detectors and MYTHEN micro-strip detectors have transformed synchrotron research by enabling new data acquisition modes and even novel experiments. At the same time data quality has improved due to the noise-free operation and the direct conversion of the X-rays, while millisecond readout time and high-frame rates allow for hitherto unknown data acquisition speed and efficiency. Instant retrigger technology, introduced in 2012 with the PILATUS3 further improves the count-rate capabilities to 107 photons/sec/pixel, allowing single photon counting at brightest synchrotron beamlines. On the other hand, the unique properties of these detectors have also been explored to improve and accelerate diffraction and scattering experiments in the laboratory. The noise-free operation is a key advantage in combination with the low-flux laboratory sources, allowing for high-throughput and optimal data quality. The modular architecture of the detectors and the vacuum-compatibility of the PILATUS detector modules are ideal prerequisites to design specific detector solutions. In-vacuum operation is ideally suited to eliminate all background arising from windows and air, resulting in optimal signal-to-noise ratio. Furthermore, the lowest accessible X-ray energy is no longer limited by windows and air absorption but rather by the beamline spectrum and the detector. The minimal X-ray energy compatible with noise-free counting for the PILATUS is below 2 keV. With EIGER, hybrid pixel detectors will enter into a new realm of spatial and temporal resolution. Continuous read-out with frame rates up to 3000 Hz and a pixel size of 75 µm are ideally suited for all scanning type of imaging experiments, time-resolved and high-throughput experiments as well as for outrunning radiation damage. A short overview of the novel aspects of the detector technology will be given. The main emphasize of the presentation will be on the science enabled by the combination of advanced source, optics and detector instrumentation.

Pixel readout IC for CdTe detectors operating in single photon counting mode with interpixel communication

2022 ◽  
Vol 17 (01) ◽  
pp. C01036
Author(s):  
P. Grybos ◽  
R. Kleczek ◽  
P. Kmon ◽  
A. Krzyzanowska ◽  
P. Otfinowski ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Single Photon ◽  
Photon Counting ◽  
Recognition Algorithm ◽  
Total Charge ◽  
Readout Integrated Circuit ◽  
Single Photon Counting ◽  
X Ray ◽  
Pixel Detectors ◽  
Photon Counting Mode

Abstract This paper presents a readout integrated circuit (IC) of pixel architecture called MPIX (Multithreshold PIXels), designed for CdTe pixel detectors used in X-ray imaging applications. The MPIX IC area is 9.6 mm × 20.3 mm and it is designed in a CMOS 130 nm process. The IC core is a matrix of 96 × 192 square-shaped pixels of 100 µm pitch. Each pixel contains a fast analog front-end followed by four independently working discriminators and four 12-bit ripple counters. Such pixel architecture allows photon processing one by one and selecting the X-ray photons according to their energy (X-ray colour imaging). To fit the different range of applications the MPIX IC has 8 possible different gain settings, and it can process the X-ray photons of energy up to 154 keV. The MPIX chip is bump-bonded to the CdTe 1.5 mm thick pixel sensor with a pixel pitch of 100 µm. To deal with the charge sharing effect coming from a thick semiconductor pixel sensor, multithreshold pattern recognition algorithm is implemented in the readout IC. The implemented algorithm operates both in the analog domain (to recover the total charge spread between neighboring pixels, when a single X-ray photon hits the border of the pixel) and in the digital domain (to allocate a hit position to a single pixel).

scholarly journals Single photon counting X-ray imaging with Si and CdTe single chip pixel detectors and multichip pixel modules

2004 ◽  
Vol 51 (4) ◽  
pp. 1717-1723 ◽  
Author(s):  
M. Locker ◽  
P. Fischer ◽  
S. Krimmel ◽  
H. Kruger ◽  
M. Lindner ◽  
...  
Keyword(s):  
Single Photon ◽  
Photon Counting ◽  
Single Chip ◽  
Single Photon Counting ◽  
X Ray ◽  
Pixel Detectors ◽  
X Ray Imaging

scholarly journals EIGER detector: application in macromolecular crystallography

2016 ◽  
Vol 72 (9) ◽  
pp. 1036-1048 ◽  
Author(s):  
Arnau Casanas ◽  
Rangana Warshamanage ◽  
Aaron D. Finke ◽  
Ezequiel Panepucci ◽  
Vincent Olieric ◽  
...  
Keyword(s):  
Data Collection ◽  
Data Quality ◽  
Data Acquisition ◽  
Dead Time ◽  
Single Photon ◽  
Photon Counting ◽  
Quality Data ◽  
Macromolecular Crystallography ◽  
Single Photon Counting ◽  
Optimal Rotation

The development of single-photon-counting detectors, such as the PILATUS, has been a major recent breakthrough in macromolecular crystallography, enabling noise-free detection and novel data-acquisition modes. The new EIGER detector features a pixel size of 75 × 75 µm, frame rates of up to 3000 Hz and a dead time as low as 3.8 µs. An EIGER 1M and EIGER 16M were tested on Swiss Light Source beamlines X10SA and X06SA for their application in macromolecular crystallography. The combination of fast frame rates and a very short dead time allows high-quality data acquisition in a shorter time. The ultrafine φ-slicing data-collection method is introduced and validated and its application in finding the optimal rotation angle, a suitable rotation speed and a sufficient X-ray dose are presented. An improvement of the data quality up to slicing at one tenth of the mosaicity has been observed, which is much finer than expected based on previous findings. The influence of key data-collection parameters on data quality is discussed.

scholarly journals Development of low-energy X-ray detectors using LGAD sensors

2019 ◽  
Vol 26 (4) ◽  
pp. 1226-1237 ◽  
Author(s):  
Marie Andrä ◽  
Jiaguo Zhang ◽  
Anna Bergamaschi ◽  
Rebecca Barten ◽  
Camelia Borca ◽  
...  
Keyword(s):  
Energy Range ◽  
Single Photon ◽  
Signal To Noise Ratio ◽  
Photon Counting ◽  
Low Energy ◽  
X Rays ◽  
Single Photon Counting ◽  
X Ray ◽  
Internal Gain ◽  
Silicon Sensors

Recent advances in segmented low-gain avalanche detectors (LGADs) make them promising for the position-sensitive detection of low-energy X-ray photons thanks to their internal gain. LGAD microstrip sensors fabricated by Fondazione Bruno Kessler have been investigated using X-rays with both charge-integrating and single-photon-counting readout chips developed at the Paul Scherrer Institut. In this work it is shown that the charge multiplication occurring in the sensor allows the detection of X-rays with improved signal-to-noise ratio in comparison with standard silicon sensors. The application in the tender X-ray energy range is demonstrated by the detection of the sulfur K α and K β lines (2.3 and 2.46 keV) in an energy-dispersive fluorescence spectrometer at the Swiss Light Source. Although further improvements in the segmentation and in the quantum efficiency at low energy are still necessary, this work paves the way for the development of single-photon-counting detectors in the soft X-ray energy range.

Beyond single photon counting X-ray detectors

2011 ◽  
Vol 628 (1) ◽  
pp. 238-241 ◽  
Author(s):  
A. Bergamaschi ◽  
R. Dinapoli ◽  
B. Henrich ◽  
I. Johnson ◽  
A. Mozzanica ◽  
...  
Keyword(s):  
Single Photon ◽  
Photon Counting ◽  
Single Photon Counting ◽  
X Ray

Operation of a single-photon–counting x-ray charge-coupled device camera spectrometer in a petawatt environment

2004 ◽  
Vol 75 (10) ◽  
pp. 3705-3707 ◽  
Author(s):  
C. Stoeckl ◽  
W. Theobald ◽  
T. C. Sangster ◽  
M. H. Key ◽  
P. Patel ◽  
...  
Keyword(s):  
Single Photon ◽  
Photon Counting ◽  
Charge Coupled Device ◽  
Single Photon Counting ◽  
X Ray

X-ray imaging of moving objects using on-chip TDI and MDX methods with single photon counting CdTe hybrid pixel detector

2021 ◽  
Vol 16 (12) ◽  
pp. C12014
Author(s):  
M. Zoladz ◽  
P. Grybos ◽  
R. Szczygiel
Keyword(s):  
Moving Objects ◽  
Single Photon ◽  
Photon Counting ◽  
Two Dimensional ◽  
Single Photon Counting ◽  
X Ray ◽  
X Ray Imaging ◽  
On Chip ◽  
Pixel Matrix ◽  
Single Pixel

Abstract X-ray imaging of moving objects using line detectors remains the most popular method of object content and structure examination with a typical resolution limited to 0.4–1 mm. Higher resolutions are difficult to obtain as, for the detector in the form of a single pixel row, the narrower the detector is, the lower the image Signal to Noise Ratio (SNR). This is because, for smaller pixel sizes, fewer photons hit the pixel in each time unit for a given radiation intensity. To overcome the trade-off between the SNR and spatial resolution, a two-dimensional sensor, namely a pixel matrix can be used. Imaging of moving objects with a pixel matrix requires time-domain integration (TDI). Straightforward TDI implementation is based on the proper accumulation of images acquired during consecutive phases of an object’s movement. Unfortunately, this method is much more demanding regarding data transfer and processing. Data from the whole pixel matrix instead of a single pixel row must be transferred out of the chip and then processed. The alternative approach is on-chip TDI implementation. It takes advantage of photons acquired by multiple rows (a higher SNR), but generates similar data amount as a single pixel row and does not require data processing out of the chip. In this paper, on-chip TDI is described and verified by using a single photon counting two-dimensional (a matrix of 128 × 192 pixels) CdTe hybrid X-ray detector with the 100 µm × 100 µm pixel size with up to four energy thresholds per pixel. Spatial resolution verification is combined with the Material Discrimination X-ray (MDX) imaging method.

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