An analytical study of hot-carrier degradation effects in sub-micron MOS devices
2008 ◽
Vol 42
(2)
◽
pp. 87-94
◽
1990 ◽
Vol 37
(5)
◽
pp. 1301-1307
◽
Keyword(s):
1993 ◽
Vol 140
(6)
◽
pp. 431
◽
Keyword(s):
1988 ◽
Vol 49
(C4)
◽
pp. C4-651-C4-655
◽
1988 ◽
Vol 49
(C4)
◽
pp. C4-787-C4-790
2021 ◽
Vol 68
(4)
◽
pp. 1804-1809