An improved test structure for recombination lifetime profile measurements in very thick silicon wafers
1993 ◽
Vol 32
(Part 2, No. 12B)
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pp. L1792-L1794
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Keyword(s):
2000 ◽
2009 ◽
Vol 24
(9)
◽
pp. 095001
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1994 ◽
2003 ◽
2009 ◽
Vol 80
(5)
◽
pp. 053906
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