scholarly journals Machine Learning and Uncertainty Quantification for Surrogate Models of Integrated Devices With a Large Number of Parameters

IEEE Access ◽  
2019 ◽  
Vol 7 ◽  
pp. 4056-4066 ◽  
Author(s):  
Riccardo Trinchero ◽  
Mourad Larbi ◽  
Hakki M. Torun ◽  
Flavio G. Canavero ◽  
Madhavan Swaminathan
2020 ◽  
Vol 62 (6) ◽  
pp. 2538-2546 ◽  
Author(s):  
Simon De Ridder ◽  
Domenico Spina ◽  
Nicola Toscani ◽  
Flavia Grassi ◽  
Dries Vande Ginste ◽  
...  

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