The resistivity changes after high voltage pulse treatment

Author(s):  
P.R. Rachnev
2020 ◽  
Vol 147 ◽  
pp. 106170 ◽  
Author(s):  
Weiran Zuo ◽  
Xinfeng Li ◽  
Fengnian Shi ◽  
Rongdong Deng ◽  
Wanzhong Yin ◽  
...  

2018 ◽  
Vol 10 (2) ◽  
pp. 02035-1-02035-6
Author(s):  
O. V. Sobol ◽  
◽  
А. А. Postelnyk ◽  
R. P. Mygushchenko ◽  
V. F. Gorban ◽  
...  

2021 ◽  
Vol 41 ◽  
pp. 102366
Author(s):  
Xiaodong Wang ◽  
Ningjing Li ◽  
Jiaxu Du ◽  
Wenqi Wang

1957 ◽  
Vol 35 (3) ◽  
pp. 324-331 ◽  
Author(s):  
W. A. Prowse ◽  
G. R. Bainbridge

A high voltage pulse lasting 0.35 microsecond is applied to a pair of delay lines, so that two pulses can be picked up from adjustable points of connection on the lines. One is applied to an irradiating gap and the other to a longer test gap, the gaps being so arranged that only mid-gap irradiation occurs. The sparking probability, P, of the test gap is used to indicate the presence of ionizing radiation. Variations of P with the time interval between the two pulses are recorded. They indicate that ionizing radiation is emitted in repeated short flashes. Photographic observations support this view.


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