Tensor Train Decomposition for Data-Driven Prognosis of Fracture Dynamics in Composite Materials

Author(s):  
Pham Luu Trung Duong ◽  
Nagarajan Raghavan ◽  
Shaista Hussain ◽  
Mark Hyunpong Jhon
IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 222256-222266
Author(s):  
Pham Luu Trung Duong ◽  
Shaista Hussain ◽  
Mark Hyunpong Jhon ◽  
Nagarajan Raghavan

2021 ◽  
Vol 68 (3) ◽  
pp. 2532-2542
Author(s):  
Huan Liu ◽  
Shuo Liu ◽  
Zheng Liu ◽  
Nezih Mrad ◽  
Abbas S. Milani

Author(s):  
Juan-Ignacio Caballero ◽  
Carlos Gonzalez ◽  
Consuelo Gonzalo-Martin ◽  
Ernestina Menasalvas ◽  
Federico Sket

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Sanjida Ferdousi ◽  
Qiyi Chen ◽  
Mehrzad Soltani ◽  
Jiadeng Zhu ◽  
Pengfei Cao ◽  
...  

AbstractInterfacial mechanical properties are important in composite materials and their applications, including vehicle structures, soft robotics, and aerospace. Determination of traction–separation (T–S) relations at interfaces in composites can lead to evaluations of structural reliability, mechanical robustness, and failures criteria. Accurate measurements on T–S relations remain challenging, since the interface interaction generally happens at microscale. With the emergence of machine learning (ML), data-driven model becomes an efficient method to predict the interfacial behaviors of composite materials and establish their mechanical models. Here, we combine ML, finite element analysis (FEA), and empirical experiments to develop data-driven models that characterize interfacial mechanical properties precisely. Specifically, eXtreme Gradient Boosting (XGBoost) multi-output regressions and classifier models are harnessed to investigate T–S relations and identify the imperfection locations at interface, respectively. The ML models are trained by macroscale force–displacement curves, which can be obtained from FEA and standard mechanical tests. The results show accurate predictions of T–S relations (R2 = 0.988) and identification of imperfection locations with 81% accuracy. Our models are experimentally validated by 3D printed double cantilever beam specimens from different materials. Furthermore, we provide a code package containing trained ML models, allowing other researchers to establish T–S relations for different material interfaces.


Author(s):  
R.R. Russell

Transmission electron microscopy of metallic/intermetallic composite materials is most challenging since the microscopist typically has great difficulty preparing specimens with uniform electron thin areas in adjacent phases. The application of ion milling for thinning foils from such materials has been quite effective. Although composite specimens prepared by ion milling have yielded much microstructural information, this technique has some inherent drawbacks such as the possible generation of ion damage near sample surfaces.


Author(s):  
K.P.D. Lagerlof

Although most materials contain more than one phase, and thus are multiphase materials, the definition of composite materials is commonly used to describe those materials containing more than one phase deliberately added to obtain certain desired physical properties. Composite materials are often classified according to their application, i.e. structural composites and electronic composites, but may also be classified according to the type of compounds making up the composite, i.e. metal/ceramic, ceramic/ceramie and metal/semiconductor composites. For structural composites it is also common to refer to the type of structural reinforcement; whisker-reinforced, fiber-reinforced, or particulate reinforced composites [1-4].For all types of composite materials, it is of fundamental importance to understand the relationship between the microstructure and the observed physical properties, and it is therefore vital to properly characterize the microstructure. The interfaces separating the different phases comprising the composite are of particular interest to understand. In structural composites the interface is often the weakest part, where fracture will nucleate, and in electronic composites structural defects at or near the interface will affect the critical electronic properties.


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