Analysis of DFT and FFT Signal Transformation with Hamming Window in LabVIEW

Author(s):  
M Chw Al Fajar ◽  
Mutia Fatmawati ◽  
Putri Wulandari ◽  
Dwi Astharini
2009 ◽  
Vol 80 (7) ◽  
pp. 076101 ◽  
Author(s):  
Abu Sebastian ◽  
S. O. Reza Moheimani

2014 ◽  
Vol 668-669 ◽  
pp. 936-939
Author(s):  
Quan Wen ◽  
Zhao Yang Ding ◽  
Fu Sheng Kou ◽  
Peng Zhou

Mechanism and functions of S-4800 Scanning Electron Microscope are introduced in this paper. The image-forming mechanism and structure of SEM are studied, and the signal transformation of secondary electron and backscattered electron is presented. The main application fields of SEM are researched.


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