Research and Application of S-4800 Scanning Electron Microscope in Modern Testing and Analysis Technology
2014 ◽
Vol 668-669
◽
pp. 936-939
Keyword(s):
Mechanism and functions of S-4800 Scanning Electron Microscope are introduced in this paper. The image-forming mechanism and structure of SEM are studied, and the signal transformation of secondary electron and backscattered electron is presented. The main application fields of SEM are researched.
2016 ◽
Vol 86
(6)
◽
pp. 734-748
◽
1988 ◽
Vol 46
◽
pp. 202-203
1986 ◽
Vol 44
◽
pp. 652-653
1997 ◽
Vol 3
(S2)
◽
pp. 385-386
◽
2003 ◽
Vol 9
(S02)
◽
pp. 1196-1197
◽