scholarly journals Analysis and compact modeling of a vertical grounded-base NPN bipolar transistor used as an ESD protection in a smart power technology

2002 ◽  
Author(s):  
G. Bertrand ◽  
C. Delage ◽  
M. Bafleur ◽  
N. Nolhier ◽  
J.M. Dorkel ◽  
...  
Keyword(s):  
Bipolar Transistor ◽  
Compact Modeling ◽  
Smart Power ◽  
Esd Protection

scholarly journals Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology

2001 ◽  
Vol 36 (9) ◽  
pp. 1373-1381 ◽  
Author(s):  
G. Bertrand ◽  
C. Delage ◽  
M. Bafleur ◽  
N. Nolhier ◽  
J.-M. Dorkel ◽  
...  
Keyword(s):  
Bipolar Transistor ◽  
Compact Modeling ◽  
Smart Power ◽  
Esd Protection

Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices

1999 ◽  
Vol 39 (6-7) ◽  
pp. 1143-1148 ◽  
Author(s):  
D. Pogany ◽  
N. Seliger ◽  
M. Litzenberger ◽  
H. Gossner ◽  
M. Stecher ◽  
...  
Keyword(s):  
Electrostatic Discharge ◽  
Damage Analysis ◽  
Smart Power ◽  
Esd Protection ◽  
Protection Devices

Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices

2000 ◽  
Vol 49 (3-4) ◽  
pp. 195-213 ◽  
Author(s):  
C. Fürböck ◽  
D. Pogany ◽  
M. Litzenberger ◽  
E. Gornik ◽  
N. Seliger ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Smart Power ◽  
Temperature Mapping ◽  
Esd Protection ◽  
Protection Devices
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