Electrical characterization of the subthreshold damage in ion implanted p-type silicon

2002 ◽  
Author(s):  
S. Fatima ◽  
C. Jagadish
Keyword(s):  
Electrical Characterization ◽  
Type Silicon ◽  
P Type ◽  
Ion Implanted

Improved electrical characterization of Al–Ti ohmic contacts on p-type ion implanted 6H-SiC

2003 ◽  
Vol 18 (6) ◽  
pp. 554-559 ◽  
Author(s):  
F Moscatelli ◽  
A Scorzoni ◽  
A Poggi ◽  
G C Cardinali ◽  
R Nipoti
Keyword(s):  
Ohmic Contacts ◽  
Electrical Characterization ◽  
P Type ◽  
Ion Implanted

Electrical Characterization of Surface Defects on Porous p-Type Silicon

1993 ◽  
Vol 143-147 ◽  
pp. 1475-1480 ◽  
Author(s):  
C. Cadet ◽  
D. Deresmes ◽  
D. Vuillaume ◽  
Didier Stiévenard ◽  
A. Grosman ◽  
...  
Keyword(s):  
Surface Defects ◽  
Electrical Characterization ◽  
Type Silicon ◽  
P Type

Electrical characterization of Cu-doped CdS p-type thin film transistors

2021 ◽  
Author(s):  
D. Berman-Mendoza ◽  
O. I. Diaz-Grijalva ◽  
R. López-Delgado ◽  
A. Ramos-Carrazco ◽  
M. E. Alvarez-Ramos ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Electrical Characterization ◽  
P Type
Sign in / Sign up

Export Citation Format

Share Document