Wrapper/TAM co-optimization, constraint-driven test scheduling, and tester data volume reduction for SOCs

Proceedings 2002 Design Automation Conference (IEEE Cat. No.02CH37324) ◽

10.1109/dac.2002.1012712 ◽

2002 ◽

Author(s):

V. Iyengar ◽

K. Chakrabarty ◽

E.J. Marinissen

Keyword(s):

Volume Reduction ◽

Test Scheduling ◽

Data Volume ◽

Optimization Constraint

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Wrapper/TAM co-optimization, constraint-driven test scheduling, and tester data volume reduction for SOCs

Proceedings 2002 Design Automation Conference (IEEE Cat. No.02CH37324) ◽

10.1145/513918.514092 ◽

2002 ◽

Author(s):

Vikram Iyengar ◽

Krishnendu Chakrabarty ◽

Erik Jan Marinissen

Keyword(s):

Volume Reduction ◽

Test Scheduling ◽

Data Volume ◽

Optimization Constraint

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Test access mechanism optimization, test scheduling, and tester data volume reduction for system-on-chip

IEEE Transactions on Computers ◽

10.1109/tc.2003.1252857 ◽

2003 ◽

Vol 52 (12) ◽

pp. 1619-1631 ◽

Author(s):

V. Iyengar ◽

K. Chakrabarty ◽

E.J. Marinissen

Keyword(s):

System On Chip ◽

Volume Reduction ◽

Test Scheduling ◽

Mechanism Optimization ◽

Test Access Mechanism ◽

Data Volume ◽

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On-board Doppler filtering for data volume reduction in spaceborne SAR systems

2014 15th International Radar Symposium (IRS) ◽

10.1109/irs.2014.6869240 ◽

2014 ◽

Author(s):

Michelangelo Villano ◽

Gerhard Krieger ◽

Vincenzo Del Zoppo

Keyword(s):

Volume Reduction ◽

Data Volume ◽

Doppler Filtering

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Scan test data volume reduction in multi-clocked designs with safe capture technique

Proceedings. International Test Conference ◽

10.1109/test.2002.1041755 ◽

2003 ◽

Author(s):

V. Jain ◽

J. Waicukauski

Keyword(s):

Test Data ◽

Volume Reduction ◽

Scan Test ◽

Data Volume ◽

Capture Technique

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Area fill generation with inherent data volume reduction

2003 Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2003.1253715 ◽

2003 ◽

Author(s):

Yu Chen ◽

A.B. Kahng ◽

G. Robins ◽

A. Zelikovsky ◽

Yuhong Zheng

Keyword(s):

Volume Reduction ◽

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Input Test Data Volume Reduction Using Seed Complementation and Multiple LFSRs

2020 IEEE 38th VLSI Test Symposium (VTS) ◽

10.1109/vts48691.2020.9107617 ◽

2020 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Test Data ◽

Volume Reduction ◽

Data Volume ◽

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A Unified Approach to Test Generation and Test Data Volume Reduction

2006 IEEE International Test Conference ◽

10.1109/test.2006.297644 ◽

2006 ◽

Author(s):

Yung-chieh Lin ◽

Kwang-ting Cheng

Keyword(s):

Test Data ◽

Test Generation ◽

Volume Reduction ◽

Unified Approach ◽

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DATA VOLUME REDUCTION STRATEGIES IN THE CMS ELECTROMAGNETIC CALORIMETER

Calorimetry in Particle Physics ◽

10.1142/9789812704894_0039 ◽

2003 ◽

Author(s):

P. PAGANINI

Keyword(s):

Volume Reduction ◽

Electromagnetic Calorimeter ◽

Reduction Strategies ◽

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Low power Illinois scan architecture for simultaneous power and test data volume reduction

2008 Design, Automation and Test in Europe ◽

10.1145/1403375.1403486 ◽

2008 ◽

Author(s):

Anshuman Chandra ◽

Felix Ng ◽

Rohit Kapur

Keyword(s):

Low Power ◽

Test Data ◽

Volume Reduction ◽

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Onboard Processing for Data Volume Reduction in High-Resolution Wide-Swath SAR

IEEE Geoscience and Remote Sensing Letters ◽

10.1109/lgrs.2016.2574886 ◽

2016 ◽

Vol 13 (8) ◽

pp. 1173-1177 ◽

Author(s):

Michelangelo Villano ◽

Gerhard Krieger ◽

Alberto Moreira

Keyword(s):

High Resolution ◽

Volume Reduction ◽

Data Volume ◽

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