High Frequency Transformer Core Loss Analysis in Isolated Modular Multilevel DC-DC Converter for MVDC Application

2019 ◽  
Author(s):  
Rachit Agarwal ◽  
Sandro Martin ◽  
Yanjun Shi ◽  
Hui Li
Keyword(s):  
High Frequency ◽  
Core Loss ◽  
Loss Analysis ◽  
High Frequency Transformer ◽  
Transformer Core

scholarly journals Calculation of core loss and copper loss in amorphous/nanocrystalline core-based high-frequency transformer

AIP Advances ◽  
2016 ◽  
Vol 6 (5) ◽  
pp. 055927 ◽  
Author(s):  
Xiaojing Liu ◽  
Youhua Wang ◽  
Jianguo Zhu ◽  
Youguang Guo ◽  
Gang Lei ◽  
...  
Keyword(s):  
High Frequency ◽  
Core Loss ◽  
Copper Loss ◽  
High Frequency Transformer

High energy resolution spectrometer for the dedicated STEM

1984 ◽  
Vol 42 ◽  
pp. 558-559 ◽  
Author(s):  
P.E. Batson
Keyword(s):  
Collection Efficiency ◽  
Core Loss ◽  
Beam Current ◽  
High Energy ◽  
High Energy Resolution ◽  
Acquisition Time ◽  
Good Definition ◽  
Loss Analysis ◽  
Definition Of ◽  
Acceleration Voltage

Use of the STEM to obtain precise electronic information has been hampered by the lack of energy loss analysis capable of a resolution and accuracy comparable to the 0.3eV energy width of the Field Emission Source. Recent work by Park, et. al. and earlier by Crewe, et. al. have promised magnetic sector devices that are capable of about 0.75eV resolution at collection angles (about 15mR) which are great enough to allow efficient use of the STEM probe current. These devices are also capable of 0.3eV resolution at smaller collection angles (4-5mR). The problem that arises, however, lies in the fact that, even with the collection efficiency approaching 1.0, several minutes of collection time are necessary for a good definition of a typical core loss or electronic transition. This is a result of the relatively small total beam current (1-10nA) that is available in the dedicated STEM. During this acquisition time, the STEM acceleration voltage may fluctuate by as much as 0.5-1.0V.

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