Stabilization technique for real-time high-resolution vascular ultrasound using frequency domain interferometry

This study proposes a method for ventricular late potentials (VLPs) detection using time-frequency representation and wavelet denoising in high-resolution electrocardiography (HRECG). The analysis is performed both with the signal averaged electrocardiography (SAECG) and in real time. A comparison between the temporal and the time-frequency analysis is also reported. In the first analysis the standard parameters QRSd, LAS40, and RMS40 were used; in the second normalized energy in time-frequency domain was calculated. The algorithm was tested adding artificial VLPs to real ECGs.

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Methods of calibration of high-resolution optical reflectometers operating in the frequency domain

Izmeritel`naya Tekhnika ◽

10.32446/0368-1025it.2018-9-40-43 ◽

2018 ◽

pp. 40-43

Author(s):

V.V. GRIGORIEV ◽

◽

V.E. KRAVTSOV ◽

A.K. MITUEV ◽

E.A. MOROZ ◽

...

Keyword(s):

High Resolution ◽

Frequency Domain

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High Resolution Ultrasound Imaging Using Frequency Domain Interferometry

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss.132.1552 ◽

2012 ◽

Vol 132 (10) ◽

pp. 1552-1557 ◽

Cited By ~ 5

Author(s):

Hirofumi Taki ◽

Takuya Sakamoto ◽

Makoto Yamakawa ◽

Tsuyoshi Shiina ◽

Toru Sato

Keyword(s):

High Resolution ◽

Frequency Domain ◽

Ultrasound Imaging

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Real-time expert system diagnostics and monitoring for the High Resolution Microwave Survey Targeted Search

10.2514/6.1993-4705 ◽

1993 ◽

Author(s):

A. Macalou ◽

B. Glass

Keyword(s):

Expert System ◽

High Resolution ◽

Real Time

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Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

ISTFA 1999: Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa1999p0039 ◽

1999 ◽

Author(s):

Kenneth Krieg ◽

Richard Qi ◽

Douglas Thomson ◽

Greg Bridges

Keyword(s):

High Resolution ◽

Integrated Circuits ◽

Real Time ◽

High Speed ◽

Time Signal ◽

Surface Imaging ◽

Atomic Force ◽

Submicron Structures ◽

High Resolution Images ◽

Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

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