Thermosonic wire bonding is a well-established process. However, when working on advanced substrate materials and the associated required metallization processes to realize innovative applications, multiple factors impede the straightforward utilization of the known process. Most prominently, the surface roughness was investigated regarding bond quality in the past. The practical application of wire bonding on difficult-to-bond substrates showed inhomogeneous results regarding this quality characteristic. This study describes investigations on the correlation among the surface roughness, profile peak density and bonding quality of Au wire bonds on thermoplastic and thermoset-based substrates used for high-frequency (HF) applications and other high-end applications. FR4 PCB (printed circuit board flame resitant class 4) were used as references and compared to HF-PCBs based on thermoset substrates with glass fabric and ceramic filler as well as technical thermoplastic materials qualified for laser direct structuring (LDS), namely LCP (liquid crystal polymer), PEEK (polyether ether ketone) and PTFE (polytetrafluoroethylene). These LDS materials for HF applications were metallized using autocatalytic metal deposition to enable three-dimensional structuring, eventually. For that purpose, bond parameters were investigated on the mentioned test substrates and compared with state-of-the-art wire bonding on FR4 substrates as used for HF applications. Due to the challenges of the limited thermal conductivity and softening of such materials under thermal load, the surface temperatures were matched up by thermography and the adaptation of thermal input. Pull tests were carried out to determine the bond quality with regard to surface roughness. Furthermore, strategies to increase reliability by the stitch-on-ball method were successfully applied.
Characterization of Wire-Bonding on LDS Materials and HF-PCBs for High-Frequency Applications
