On the selection of efficient arithmetic additive test pattern generators [logic test]

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231662 ◽

2004 ◽

Author(s):

S. Manich ◽

L. Garcia ◽

L. Balado ◽

E. Lupon ◽

J. Rius ◽

...

Keyword(s):

Test Pattern ◽

Pattern Generators ◽

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BIST test pattern generators for stuck-open and delay testing

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326862 ◽

2002 ◽

Author(s):

C.-A. Chen ◽

S.K. Gupta

Keyword(s):

Test Pattern ◽

Delay Testing ◽

Pattern Generators

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Test pattern generators for distributed and embedded built-in self-test at register transfer level

Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design ◽

10.1109/isqed.2001.915236 ◽

2002 ◽

Author(s):

V. Vorisek

Keyword(s):

Test Pattern ◽

Register Transfer Level ◽

Register Transfer ◽

Self Test ◽

Built In Self Test ◽

Pattern Generators

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Preliminary Evaluation of Artificial Neural Networks as Test Pattern Generators for BIST

2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) ◽

10.1109/itc-cscc52171.2021.9501263 ◽

2021 ◽

Author(s):

Tsutomu Inamoto ◽

Kazuki Ohtomo ◽

Yoshinobu Higami

Keyword(s):

Neural Networks ◽

Artificial Neural Networks ◽

Test Pattern ◽

Preliminary Evaluation ◽

Artificial Neural ◽

Pattern Generators

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BIST test pattern generators for two-pattern testing-theory and design algorithms

IEEE Transactions on Computers ◽

10.1109/12.485565 ◽

1996 ◽

Vol 45 (3) ◽

pp. 257-269 ◽

Author(s):

Chih-Ang Chen ◽

S.K. Gupta

Keyword(s):

Test Pattern ◽

Testing Theory ◽

Design Algorithms ◽

Pattern Generators

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Evaluation of Generalized LFSRs as Test Pattern Generators in Two-Dimensional Scan Designs

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2008.927763 ◽

2008 ◽

Vol 27 (9) ◽

pp. 1689-1692 ◽

Author(s):

Jayawant Kakade ◽

Dimitri Kagaris ◽

Dhiraj K. Pradhan

Keyword(s):

Test Pattern ◽

Two Dimensional ◽

Pattern Generators

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New Test Pattern Generators for the BIST Pseudo-Exhaustive Testing based on Coding Theory Principles

Communications on Applied Electronics ◽

10.5120/cae2016652148 ◽

2016 ◽

Vol 4 (8) ◽

pp. 29-44 ◽

Author(s):

Mohamed H. ◽

Winston Waller

Keyword(s):

Coding Theory ◽

Test Pattern ◽

Pattern Generators

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Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2007.906465 ◽

2007 ◽

Vol 26 (11) ◽

pp. 2046-2058 ◽

Author(s):

Salvador Manich ◽

Lucas Garcia-Deiros ◽

Joan Figueras

Keyword(s):

Test Pattern ◽

Test Time ◽

Pattern Generators ◽

Memory Resources

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A self-test approach using accumulators as test pattern generators

Proceedings of ISCAS'95 - International Symposium on Circuits and Systems ◽

10.1109/iscas.1995.523844 ◽

2002 ◽

Author(s):

A.P. Stroele

Keyword(s):

Test Pattern ◽

Self Test ◽

Pattern Generators

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Efficient test pattern generators based on specific cellular automata structures

Microelectronics Reliability ◽

10.1016/s0026-2714(02)00033-1 ◽

2002 ◽

Vol 42 (6) ◽

pp. 975-983 ◽

Author(s):

T. Garbolino ◽

A. Hławiczka

Keyword(s):

Cellular Automata ◽

Test Pattern ◽

Efficient Test ◽

Pattern Generators

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Avoiding linear dependencies in LFSR test pattern generators

Journal of Electronic Testing ◽

10.1007/bf00993089 ◽

1995 ◽

Vol 6 (2) ◽

pp. 229-241 ◽

Author(s):

Dimitrios Kagaris ◽

Spyros Tragoudas

Keyword(s):

Test Pattern ◽

Pattern Generators

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