The Eighth IEEE European Test Workshop, 2003. Proceedings.
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25

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Automatic worst case pattern generation using neural networks & genetic algorithm for estimation of switching noise on power supply lines in CMOS circuits

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231676 ◽

2004 ◽

Author(s):

E. Liau ◽

D. Schmitt-Landsiedel

Keyword(s):

Genetic Algorithm ◽

Neural Networks ◽

Power Supply ◽

Pattern Generation ◽

Cmos Circuits ◽

Switching Noise ◽

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Scan test strategy for asynchronous-synchronous interfaces [SoC testing]

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231667 ◽

2004 ◽

Author(s):

O. Petre ◽

H.G. Kerkhoff

Keyword(s):

Test Strategy ◽

Soc Testing ◽

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Control-aware test architecture design for modular SOC testing

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231669 ◽

2004 ◽

Author(s):

S.K. Goel ◽

E.J. Marinissen

Keyword(s):

Architecture Design ◽

Soc Testing ◽

Test Architecture

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On the selection of efficient arithmetic additive test pattern generators [logic test]

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231662 ◽

2004 ◽

Author(s):

S. Manich ◽

L. Garcia ◽

L. Balado ◽

E. Lupon ◽

J. Rius ◽

...

Keyword(s):

Test Pattern ◽

Pattern Generators ◽

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Importance of dynamic faults for new SRAM technologies

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231665 ◽

2004 ◽

Author(s):

S. Hamdioui ◽

R. Wadsworth ◽

J. Delos Reyes ◽

A.J. van de Goor

Keyword(s):

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A practical evaluation of I/sub DDQ/ test strategies for deep submicron production test application. Experiences and targets from the field

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231670 ◽

2004 ◽

Author(s):

A. Fudoli ◽

A. Ascagni ◽

D. Appello ◽

H. Manhaeve

Keyword(s):

Deep Submicron ◽

Production Test ◽

Test Strategies ◽

Test Application ◽

Practical Evaluation

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Parity-based output compaction for core-based SOCs [logic testing]

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231663 ◽

2004 ◽

Author(s):

O. Sinanoglu ◽

A. Orailoglu

Keyword(s):

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Code generation for functional validation of pipelined microprocessors

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231677 ◽

2004 ◽

Author(s):

F. Corno ◽

G. Squillero ◽

M. Sonza Reorda

Keyword(s):

Code Generation ◽

Functional Validation ◽

Pipelined Microprocessors

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Automating test program generation in STIL - expectations and experiences using IEEE 1450 [standard test interface language]

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231675 ◽

2004 ◽

Author(s):

H. Lang ◽

B. Pande ◽

H. Ahrens

Keyword(s):

Standard Test ◽

Test Program ◽

Program Generation

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Enhanced P1500 compliant wrapper suitable for delay fault testing of embedded cores

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231678 ◽

2004 ◽

Author(s):

H.J. Vermaak ◽

H.G. Kerkhoff

Keyword(s):

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

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