Test Power and Transition Fault Coverage Comparison Between LOC and LOS Test Scheme for Multiple Clock Domain Circuits

2017 IEEE International Conference on Computational Intelligence and Computing Research (ICCIC) ◽

10.1109/iccic.2017.8524188 ◽

2017 ◽

Author(s):

Sakshcc Pandey ◽

N.S. Murty ◽

Ravi Ranjan

Keyword(s):

Fault Coverage ◽

Test Scheme ◽

Transition Fault

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A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes

Journal of Low Power Electronics ◽

10.1166/jolpe.2010.1086 ◽

2010 ◽

Vol 6 (2) ◽

pp. 359-374 ◽

Author(s):

F. Wu ◽

L. Dilillo ◽

A. Bosio ◽

P. Girard ◽

S. Pravossoudovitch ◽

...

Keyword(s):

Power Dissipation ◽

Fault Coverage ◽

Comprehensive Analysis ◽

Transition Fault

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Conflict driven scan chain configuration for high transition fault coverage and low test power

2009 Asia and South Pacific Design Automation Conference ◽

10.1109/aspdac.2009.4796556 ◽

2009 ◽

Author(s):

Zhen Chen ◽

Boxue Yin ◽

Dong Xiang

Keyword(s):

Fault Coverage ◽

Transition Fault ◽

High Transition ◽

Chain Configuration

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A Controller Augmentation Method to Improve Transition Fault Coverage for RTL Data-Paths

2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2019.8854445 ◽

2019 ◽

Author(s):

Yuki Takeuchi ◽

Toshinori Hosokawa ◽

Hiroshi Yamazaki ◽

Masayoshi Yoshimura

Keyword(s):

Fault Coverage ◽

Transition Fault

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On the relationship between stuck-at fault coverage and transition fault coverage

2009 Design, Automation & Test in Europe Conference & Exhibition ◽

10.1109/date.2009.5090848 ◽

2009 ◽

Author(s):

J. Schat

Keyword(s):

Fault Coverage ◽

Transition Fault ◽

The Relationship

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Empirical Analysis of the Dependence of Test Power, Delay, Energy and Fault Coverage on the Architecture of LFSR-Based TPGs

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) ◽

10.1109/dft.2007.27 ◽

2007 ◽

Author(s):

Somayyeh Koohi ◽

Shaahin Hessabi

Keyword(s):

Empirical Analysis ◽

Fault Coverage ◽

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Augmenting Functional Broadside Tests for Transition Fault Coverage with Bounded Switching Activity

2011 IEEE 17th Pacific Rim International Symposium on Dependable Computing ◽

10.1109/prdc.2011.14 ◽

2011 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Fault Coverage ◽

Switching Activity ◽

Transition Fault

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The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.15 ◽

2009 ◽

Author(s):

Zhen Chen ◽

Dong Xiang ◽

Boxue Yin

Keyword(s):

Fault Coverage ◽

Test Cost ◽

Transition Fault ◽

High Transition

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Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based Tests

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2008.2010216 ◽

2010 ◽

Vol 18 (2) ◽

pp. 333-337 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Fault Coverage ◽

Transition Fault

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Generation of New March Tests with Low Test Power and High Fault Coverage by Test Sequence Reordering Using Genetic Algorithm

2009 International Conference on Advances in Recent Technologies in Communication and Computing ◽

10.1109/artcom.2009.52 ◽

2009 ◽

Author(s):

Gayathri C.V. ◽

Kayalvizhi N. ◽

Mallikadevi M.

Keyword(s):

Genetic Algorithm ◽

Fault Coverage ◽

Test Sequence ◽

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On achieving a complete fault coverage for sequential machines using the transition fault model

Proceedings of the 28th conference on ACM/IEEE design automation conference - DAC '91 ◽

10.1145/127601.127691 ◽

1991 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Fault Coverage ◽

Fault Model ◽

Sequential Machines ◽

Transition Fault

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