Research on Single-Event Vulnerability and Hardening for a Pipelined ADC

2021 4th International Conference on Circuits, Systems and Simulation (ICCSS) ◽

10.1109/iccss51193.2021.9464194 ◽

2021 ◽

Author(s):

Zulin Chen ◽

Zongmin Wang ◽

Tieliang Zhang ◽

Long Yang ◽

Xiang Jin

Keyword(s):

Pipelined Adc ◽

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The retention of a single event: I. Remembering the length of a line.

PsycEXTRA Dataset ◽

10.1037/e442892004-001 ◽

1980 ◽

Author(s):

Lars H Alin

Keyword(s):

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The retention of a single event: IV. The retention of the loudness of a tone with and without proactive or retroactive interference. A complementary study with a change of method.

PsycEXTRA Dataset ◽

10.1037/e453212004-001 ◽

1980 ◽

Author(s):

Lars H. Alin ◽

Christina Gustafsson-Lundquist ◽

Ewa Larsson ◽

Paul Wetterholm

Keyword(s):

Retroactive Interference ◽

Single Event ◽

Complementary Study

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Psychometric Properties of the Hebrew Version of the PTCI Following Single Event Trauma

PsycEXTRA Dataset ◽

10.1037/e517302011-381 ◽

2008 ◽

Author(s):

Ayala Daie-Gabai ◽

Idan Aderka ◽

Edna Foa ◽

Naama Shafran ◽

Eva Gilboa-Schechtman

Keyword(s):

Psychometric Properties ◽

Single Event ◽

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A 7.21-bit ENOB 100MS/s 1.51mW Inverter based Pipelined ADC with Digital Calibration for Breast Cancer Detection System

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss.140.585 ◽

2020 ◽

Vol 140 (6) ◽

pp. 585-591

Author(s):

Yoshihiro Masui ◽

Tsukasa Nishimiya ◽

Allex Uemi ◽

Akihiro Toya ◽

Takamaro Kikkawa

Keyword(s):

Breast Cancer ◽

Cancer Detection ◽

Detection System ◽

Breast Cancer Detection ◽

Digital Calibration ◽

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Reliability Design for Neutron Induced Single-Event Burnout of IGBT

IEEJ Transactions on Industry Applications ◽

10.1541/ieejias.131.992 ◽

2011 ◽

Vol 131 (8) ◽

pp. 992-999 ◽

Author(s):

Tomoyuki Shoji ◽

Shuichi Nishida ◽

Toyokazu Ohnishi ◽

Touma Fujikawa ◽

Noboru Nose ◽

...

Keyword(s):

Single Event ◽

Reliability Design

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Digital Background Calibration for a 14-bit 100-MS/s Pipelined ADC Using Signal-Dependent Dithering

IEICE Transactions on Electronics ◽

10.1587/transele.e97.c.207 ◽

2014 ◽

Vol E97.C (3) ◽

pp. 207-214

Author(s):

Zhao-xin XIONG ◽

Min CAI ◽

Xiao-Yong HE ◽

Yun YANG

Keyword(s):

Pipelined Adc ◽

Background Calibration ◽

Digital Background Calibration

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Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e99.a.1198 ◽

2016 ◽

Vol E99.A (6) ◽

pp. 1198-1205

Author(s):

Go MATSUKAWA ◽

Yuta KIMI ◽

Shuhei YOSHIDA ◽

Shintaro IZUMI ◽

Hiroshi KAWAGUCHI ◽

...

Keyword(s):

Error Propagation ◽

Single Event Upset ◽

Single Event ◽

Propagation Analysis ◽

Error Propagation Analysis

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A gate-level model for single-event upset simulation

Future Communication Technology ◽

10.2495/icct130431 ◽

2014 ◽

Author(s):

Lei Li ◽

Ran Dai

Keyword(s):

Single Event Upset ◽

Single Event ◽

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Equivalent Properties of Single Event Burnout in Power MOSFET Induced by Heavy Ion and 252Cf Fission Fragment

57th International Astronautical Congress ◽

10.2514/6.iac-06-c2.6.08 ◽

2006 ◽

Author(s):

Zhou Cao ◽

Shiyu Yang ◽

YuXiong Xue ◽

Daoan Da

Keyword(s):

Fission Fragment ◽

Heavy Ion ◽

Single Event ◽

Power Mosfet ◽

Equivalent Properties

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VLSI DESIGN OF PIPELINED ADC WITH WIDE RANGE OPERATING TEMPERATURE FOR WAVE APPLICATIONS

i-manager’s Journal on Wireless Communication Networks ◽

10.26634/jwcn.6.2.13965 ◽

2017 ◽

Vol 6 (2) ◽

pp. 13

Author(s):

P LOKESH ◽

U. SOMALATHA ◽

S. CHANDANA ◽

◽

◽

...

Keyword(s):

Operating Temperature ◽

Vlsi Design ◽

Pipelined Adc ◽

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