scholarly journals Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment

Author(s):  
Swaraj Mahato ◽  
Georges Gielen
2018 ◽  
Vol E101.C (1) ◽  
pp. 82-90
Author(s):  
Chang LIU ◽  
Zhi ZHANG ◽  
Zhiping WANG

Author(s):  
Z. Zhang ◽  
Z.H. Li ◽  
W.R. Zhang ◽  
F.Y. Zhao ◽  
C.L. Chen ◽  
...  

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