A Broadband Single-Pole Single-Throw Switch With Ground-Slot Coupling Structure in 65 nm Bulk CMOS

Author(s):  
Jiang Luo ◽  
Qunfei Han ◽  
Hongchang Shen ◽  
Xing Quan ◽  
Guodong Su
2015 ◽  
Vol 25 (12) ◽  
pp. 799-801 ◽  
Author(s):  
Guoliang Li ◽  
Kaijun Song ◽  
Fan Zhang ◽  
Yu Zhu

2006 ◽  
Vol 42 (25) ◽  
pp. 1461 ◽  
Author(s):  
G.M. Yang ◽  
R.H. Jin ◽  
J.P. Geng

2020 ◽  
Vol 2020 ◽  
pp. 1-7
Author(s):  
Pengtao Zhang ◽  
Peng Bai ◽  
Chaoqi Fu ◽  
Shanshan Li

Network repair is indispensable for maintaining network security. Conventional static repair is relatively inefficient. In this study, by considering the energy transfer between nodes, a dynamic repair model was established. The fundamental reason for the secondary failure of repaired nodes during the dynamic repair process is the coupling structure of failure networks. A dynamic repair strategy was proposed that can effectively prevent the secondary failure of repair nodes influenced by energy during repair and can cause the redundant capacity of repair nodes to be used reasonably. By turning off the energy transfer function of the link to control the excessive flow of energy into the repair node to avoid the occurrence of secondary failure; on the other hand, by sharing part of the load of the failure node, realize the rational use of the redundant capacity of the repair node to reduce the impact of the failure node on the overall function of the network. The proposed strategy mitigated the effect of failure nodes on network functions and substantially improved the recovery efficiency of network functions. Furthermore, redundant edges, behaving as energy redundant links in a network structure, can considerably improve the robustness of the network by optimizing the removal of redundant edges. Dynamic repair is not only an efficient repair method but also a highly flexible choice for network repair.


1998 ◽  
Vol 72 (6) ◽  
pp. 668-670 ◽  
Author(s):  
Y.-K. Park ◽  
J.-I. Han ◽  
M.-G. Kwak ◽  
H. Yang ◽  
S.-H. Ju ◽  
...  
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