Design of capacitance parameter measuring instrument based on virtual instrument

Author(s):  
Hui Zhu ◽  
Lijun Jin ◽  
Xiaojun Shen ◽  
Yuzhuo Shen ◽  
Kai Gu
2014 ◽  
Vol 22 (11) ◽  
pp. 3038-3043 ◽  
Author(s):  
胡鹏浩 HU Peng-hao ◽  
胡毅 HU Yi ◽  
党学明 DANG Xue-ming

2011 ◽  
Vol 97-98 ◽  
pp. 976-980
Author(s):  
Wen Liang Zhu ◽  
Jian Li ◽  
Fang Yu

This paper bases on LabVIEW, combines corresponding NI industrial computer and DAQ card, completes stress strain signal data acquisition and processing automatically. It had real time storage, data processing and other functions. It had the advantages of flexibility using, portability and costly effective. It shows that using the NI computer testing replaces traditional strain measuring instrument, which has an important signification for stress and strain signal data acquisition and processing.


2014 ◽  
Vol 955-959 ◽  
pp. 1272-1275
Author(s):  
Yi Wang Wang ◽  
Cheng Cheng Zhang ◽  
Jun Lu ◽  
Shan Zhong

A design of novel wireless environment parameter measuring instrument based on solar energy is introduced in this paper.The measurement instrument uses solar self-powered technology,can achieve the rapid detection and display of particulate matter, light intensity, temperature, humidity,noise and other environmental parameters,and uses wireless networking and PC terminal to form a network.The measuring instrument also has a control output function,the control output can be set according to the parameters, to meet the needs of different applications. The hardware and software development of the instrument were realized.And through the experiments showed that the designed measuring instrument can quickly and accurately detect a variety of environmental parameters, full-featured, cost-effective, wide, and has broad application prospects.


2014 ◽  
Vol 613 ◽  
pp. 101-107
Author(s):  
Dominic Gnieser ◽  
Carl Georg Frase ◽  
Harald Bosse ◽  
Rainer Tutsch

To assure the metrological traceability of a measurement, it is required to perform an analysis of the measurement uncertainty specific to the measurement task. An approach to estimate the measurement uncertainty for complex systems is the so-called virtual measuring instrument: The measuring process is simulated taking into account its influencing parameters and a statistical analysis is performed by means of Monte-Carlo calculations. We present the development of such a virtual measuring instrument for scanning electron microscopy (SEM) which allows to estimate the measurement uncertainty in compliance with GUM for dimensional measuring tasks in nano- and microsystems technology. By application of this virtual instrument, model based corrections of systematic errors are made possible and the cognition of the strength of different perturbing influences can lead to recommendations to optimize measurement instruments and methods. The virtual model programmed in MATLAB is called ‘vREM’, it includes all essential components of the measuring chain of an SEM as modules: The electron source, the electron-optical lens-system, the scan-generator, the interaction of the electrons within the object, electron detectors, simple analysis procedures and consideration of external disturbances. By adjusting parameters uncertainty contributions can be assigned to the virtual probe, the virtual specimen and the virtual detector signals.


Metrologiya ◽  
2020 ◽  
pp. 16-24
Author(s):  
Alexandr D. Chikmarev

A single program has been developed to ensure that the final result of the data processing of the measurement calibration protocol is obtained under normal conditions. The calibration result contains a calibration function or a correction function in the form of a continuous sedate series and a calibration chart based on typical additive error probabilities. Solved the problem of the statistical treatment of the calibration protocol measuring in normal conditions within a single program “MMI–calibration 3.0” that includes identification of the calibration function in a continuous power series of indications of a measuring instrument and chart calibration. An example of solving the problem of calibration of the thermometer by the working standard of the 3rd grade with the help of the “MMI-calibration 3.0” program.


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