TDLAS using FPGA-based lock-in detection for multi-channel Chemical Species Tomography

Author(s):  
Andrea Chighine ◽  
Stylianos-Alexios Tsekenis ◽  
Edward Fisher ◽  
Nick Polydorides ◽  
David Wilson ◽  
...  
Keyword(s):  
Author(s):  
Andrea Chighine ◽  
Edward Fisher ◽  
David Wilson ◽  
Michael Lengden ◽  
Walter Johnstone ◽  
...  

1993 ◽  
Vol 47 (9) ◽  
pp. 1411-1416 ◽  
Author(s):  
J.-N. Chazalviel ◽  
V. M. Dubin ◽  
K. C. Mandal ◽  
F. Ozanam

Performing infrared spectroscopy of chemical species at the electrochemical interface represents a difficult challenge in terms of sensitivity (1 monolayer ∼1015 species/cm2) and selectivity (presence of the electrolyte). These problems are efficiently addressed by using modulation coupled with lock-in detection of the optical signal. The electrode potential, which governs the interface behavior, is the most straightforward physical quantity that can be modulated. Such a modulation technique may be combined with Fourier transform spectroscopy by using an interferometer with a very slow scanning speed of the movable mirror (∼1–10 μm/s). This approach allows one to reach high sensitivity (typical minimum detectable signal Δ I/I ∼ 10−6 in a single-reflection arrangement). In some special cases, other modulations may be of interest, for example, modulation of the light at a semiconducting photoelectrode. A common benefit of these modulation techniques is that the resulting response can be analyzed as a function of the modulation frequency or by consideration of the phase of the signal at a given frequency. As can be shown for several examples, this analysis allows one to distinguish between the various physical and electrochemical processes taking place at the interface: change of free-carrier concentration beneath the electrode surface or of ion populations in the ionic double layer, adsorptiondesorption effects, and Faradaic processes, for which useful information on the reaction mechanisms may be obtained.


Author(s):  
R. H. Duff

A material irradiated with electrons emits x-rays having energies characteristic of the elements present. Chemical combination between elements results in a small shift of the peak energies of these characteristic x-rays because chemical bonds between different elements have different energies. The energy differences of the characteristic x-rays resulting from valence electron transitions can be used to identify the chemical species present and to obtain information about the chemical bond itself. Although these peak-energy shifts have been well known for a number of years, their use for chemical-species identification in small volumes of material was not realized until the development of the electron microprobe.


Author(s):  
J. Barbillat ◽  
M. Delhaye ◽  
P. Dhamelincourt

Raman mapping, with a spatial resolution close to the diffraction limit, can help to reveal the distribution of chemical species at the surface of an heterogeneous sample.As early as 1975,three methods of sample laser illumination and detector configuration have been proposed to perform Raman mapping at the microscopic level (Fig. 1),:- Point illumination:The basic design of the instrument is a classical Raman microprobe equipped with a PM tube or either a linear photodiode array or a two-dimensional CCD detector. A laser beam is focused on a very small area ,close to the diffraction limit.In order to explore the whole surface of the sample,the specimen is moved sequentially beneath the microscope by means of a motorized XY stage. For each point analyzed, a complete spectrum is obtained from which spectral information of interest is extracted for Raman image reconstruction.- Line illuminationA narrow laser line is focused onto the sample either by a cylindrical lens or by a scanning device and is optically conjugated with the entrance slit of the stigmatic spectrograph.


1992 ◽  
Vol 64 (19) ◽  
pp. 931A-940A ◽  
Author(s):  
Totaro Imasaka ◽  
Masami Hozumi ◽  
Nobuhiko Ishibashi

1995 ◽  
Vol 7 (1) ◽  
pp. 215-228 ◽  
Author(s):  
J. Rantala ◽  
D. Wu ◽  
G. Busse
Keyword(s):  

1982 ◽  
Vol 43 (5) ◽  
pp. 755-759 ◽  
Author(s):  
M. Bertault ◽  
M. Krauzman ◽  
M. Le Postollec ◽  
R.M. Pick ◽  
M. Schott

2012 ◽  
Vol 132 (11) ◽  
pp. 1033-1038
Author(s):  
Yuichiro Kai ◽  
Yuji Tsuchida ◽  
Takashi Todaka ◽  
Masato Enokizono

Sign in / Sign up

Export Citation Format

Share Document