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Genetic algorithms for scan path design
Proceedings of 9th International Conference on VLSI Design
◽
10.1109/icvd.1996.489469
◽
2002
◽
Author(s):
C.P. Ravikumar
◽
N. Rajarajan
Keyword(s):
Genetic Algorithms
◽
Path Design
◽
Scan Path
Download Full-text
Related Documents
Cited By
References
The Economics of Scan-Path Design for Testability
Economics of Electronic Design, Manufacture and Test
◽
10.1007/978-1-4757-5048-5_5
◽
1994
◽
pp. 53-67
◽
Cited By ~ 2
Author(s):
Prab Varma
◽
Tushar Gheewala
Keyword(s):
Design For Testability
◽
Path Design
◽
Scan Path
Download Full-text
Arrangement of latches in scan-path design to improve delay fault coverage
Proceedings. International Test Conference 1990
◽
10.1109/test.1990.114046
◽
2002
◽
Cited By ~ 36
Author(s):
W. Mao
◽
M.D. Ciletti
Keyword(s):
Fault Coverage
◽
Delay Fault
◽
Path Design
◽
Scan Path
Download Full-text
Cost-free scan: a low-overhead scan path design
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/43.720320
◽
1998
◽
Vol 17
(9)
◽
pp. 852-861
◽
Cited By ~ 5
Author(s):
Chih-Chang Lin
◽
M. Marek-Sadowska
◽
M.T.-C. Lee
◽
Kuang-Chien Chen
Keyword(s):
Path Design
◽
Scan Path
Download Full-text
Reducing correlation to improve coverage of delay faults in scan-path design
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/43.277638
◽
1994
◽
Vol 13
(5)
◽
pp. 638-646
◽
Cited By ~ 17
Author(s):
Weiwei Mao
◽
M.D. Ciletti
Keyword(s):
Delay Faults
◽
Path Design
◽
Scan Path
Download Full-text
On scan path design for stuck-open and delay fault detection
Proceedings ETC 93 Third European Test Conference
◽
10.1109/etc.1993.246553
◽
2002
◽
Cited By ~ 8
Author(s):
J. Leenstra
◽
M. Koch
◽
T. Schwederski
Keyword(s):
Fault Detection
◽
Delay Fault
◽
Path Design
◽
Scan Path
Download Full-text
Correlation-reduced scan-path design to improve delay fault coverage
Proceedings of the 28th conference on ACM/IEEE design automation conference - DAC '91
◽
10.1145/127601.127631
◽
1991
◽
Cited By ~ 6
Author(s):
Weiwei Mao
◽
Michael D. Ciletti
Keyword(s):
Fault Coverage
◽
Delay Fault
◽
Path Design
◽
Scan Path
Download Full-text
The economics of scan-path design for testability
Journal of Electronic Testing
◽
10.1007/bf00972078
◽
1994
◽
Vol 5
(2-3)
◽
pp. 179-193
◽
Cited By ~ 2
Author(s):
Prab Varma
◽
Tushar Gheewala
Keyword(s):
Design For Testability
◽
Path Design
◽
Scan Path
Download Full-text
Cost-free scan: a low-overhead scan path design methodology
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)
◽
10.1109/iccad.1995.480167
◽
2002
◽
Author(s):
Chih-Chang Lin
◽
M.T.-C. Lee
◽
M. Marek-Sadowska
◽
Kuang-Chien Chen
Keyword(s):
Design Methodology
◽
Path Design
◽
Scan Path
Download Full-text
An Empirical Approach to RTL Scan Path Design Focusing on Structural Interpretation in Logic Synthesis
2019 IEEE International Test Conference in Asia (ITC-Asia)
◽
10.1109/itc-asia.2019.00023
◽
2019
◽
Author(s):
Tsuyoshi Iwagaki
◽
Sho Yuasa
◽
Hideyuki Ichihara
◽
Tomoo Inoue
Keyword(s):
Logic Synthesis
◽
Empirical Approach
◽
Structural Interpretation
◽
Path Design
◽
Scan Path
Download Full-text
Hierarchical time-optimal control of a continuous copolymerization reactor during start-up or grade change operation using genetic algorithms
Computers & Chemical Engineering
◽
10.1016/s0098-1354(97)00186-5
◽
1997
◽
Vol 21
(1-2)
◽
pp. S1037-S1042
Author(s):
H Moo
Keyword(s):
Optimal Control
◽
Genetic Algorithms
◽
Time Optimal Control
◽
Grade Change
◽
Start Up
◽
Time Optimal
◽
Change Operation
◽
Grade Change Operation
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