Arrangement of latches in scan-path design to improve delay fault coverage

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114046 ◽

2002 ◽

Author(s):

W. Mao ◽

M.D. Ciletti

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Path Design ◽

Download Full-text

Correlation-reduced scan-path design to improve delay fault coverage

Proceedings of the 28th conference on ACM/IEEE design automation conference - DAC '91 ◽

10.1145/127601.127631 ◽

1991 ◽

Author(s):

Weiwei Mao ◽

Michael D. Ciletti

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Path Design ◽

Download Full-text

A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270884 ◽

2004 ◽

Author(s):

Seongmoon Wang ◽

S.T. Chakradhar

Keyword(s):

Fault Coverage ◽

Insertion Technique ◽

Delay Fault ◽

Test Point Insertion ◽

Download Full-text

On scan path design for stuck-open and delay fault detection

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246553 ◽

2002 ◽

Author(s):

J. Leenstra ◽

M. Koch ◽

T. Schwederski

Keyword(s):

Fault Detection ◽

Delay Fault ◽

Path Design ◽

Download Full-text

A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2005.855929 ◽

2006 ◽

Vol 25 (8) ◽

pp. 1555-1564 ◽

Author(s):

Seongmoon Wang ◽

S.T. Chakradhar

Keyword(s):

Fault Coverage ◽

Insertion Technique ◽

Delay Fault ◽

Test Point Insertion ◽

Download Full-text

The Economics of Scan-Path Design for Testability

Economics of Electronic Design, Manufacture and Test ◽

10.1007/978-1-4757-5048-5_5 ◽

1994 ◽

pp. 53-67 ◽

Author(s):

Prab Varma ◽

Tushar Gheewala

Keyword(s):

Design For Testability ◽

Path Design ◽

Download Full-text

Flip–flop selection for partial enhance scan chain using DTESFF for high transition delay fault coverage

International Journal of Systems Assurance Engineering and Management ◽

10.1007/s13198-013-0170-9 ◽

2013 ◽

Vol 4 (3) ◽

pp. 303-311 ◽

Author(s):

Ashok Kumar Suhag ◽

Vivek Shrivastava ◽

Nidhi Singh

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Flip Flop ◽

High Transition ◽

Selection For ◽

Transition Delay ◽

Download Full-text

Nonenumerative path delay fault coverage estimation with optimal algorithms

Proceedings International Conference on Computer Design VLSI in Computers and Processors ICCD-97 ◽

10.1109/iccd.1997.628896 ◽

2002 ◽

Author(s):

D. Kagaris ◽

S. Tragoudas ◽

D. Karayiannis

Keyword(s):

Fault Coverage ◽

Optimal Algorithms ◽

Delay Fault ◽

Path Delay Fault ◽

Coverage Estimation ◽

Fault Coverage Estimation

Download Full-text

Improved delay fault coverage in SoC using controllable multi-Scan-Enable

2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology ◽

10.1109/icsict.2010.5667837 ◽

2010 ◽

Author(s):

Jin-yi Zhang ◽

Xu-hui Huang ◽

Wan-lin Cai ◽

Han-yi Weng

Keyword(s):

Fault Coverage ◽

Download Full-text

Improving small-delay fault coverage for on-chip delay measurement

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378223 ◽

2012 ◽

Author(s):

Wenpo Zhang ◽

Kazuteru Namba ◽

Hideo Ito

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Delay Measurement ◽

Small Delay ◽

Download Full-text

Delay fault coverage and performance tradeoffs

Proceedings of the 30th international on Design automation conference - DAC '93 ◽

10.1145/157485.164970 ◽

1993 ◽

Author(s):

William K. Lam ◽

Alexander Saldanha ◽

Robert K. Brayton ◽

Alberto L. Sangiovanni-Vincentelli

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

And Performance

Download Full-text