Performance and hot-carrier reliability of deep-submicrometer CMOS

2008 ◽

Vol 56 (5) ◽

pp. 1295-1300 ◽

Cited By ~ 1

Author(s):

Hao Su ◽

Hong Wang ◽

Tao Xu ◽

Rong Zeng

Keyword(s):

Spatial Location ◽

Hot Carrier ◽

Deep Submicrometer ◽

Rf Noise

Download Full-text

Hot carrier stress in deep submicrometer MOSFET's

2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) ◽

10.1109/smicnd.2001.967516 ◽

2002 ◽

Author(s):

B. Cretu ◽

F. Balestra ◽

G. Ghibaudo

Keyword(s):

Hot Carrier ◽

Deep Submicrometer ◽

Hot Carrier Stress

Download Full-text

Hot carrier reliability in deep submicrometer MOSFETs

10.1109/iedm.1990.237134 ◽

2002 ◽

Cited By ~ 2

Author(s):

H. Hazama ◽

M. Iwase ◽

S. Takagi

Keyword(s):

Hot Carrier ◽

Deep Submicrometer

Download Full-text

High-energy tail electrons as the mechanism for the worst-case hot-carrier stress degradation of the deep submicrometer N-MOSFET

IEEE Electron Device Letters ◽

10.1109/led.2003.814011 ◽

2003 ◽

Vol 24 (7) ◽

pp. 469-471 ◽

Cited By ~ 16

Author(s):

D.S. Ang ◽

T.W.H. Phua ◽

H. Liao ◽

C.H. Ling

Keyword(s):

High Energy ◽

Worst Case ◽

Hot Carrier ◽

High Energy Tail ◽

Deep Submicrometer ◽

Hot Carrier Stress ◽

Stress Degradation

Download Full-text

Analysis of the hot-carrier degradation of deep-submicrometer large-angle-tilt-implanted drain (LATID) MOSFETs

Solid-State Electronics ◽

10.1016/s0038-1101(97)00074-9 ◽

1997 ◽

Vol 41 (9) ◽

pp. 1293-1301 ◽

Cited By ~ 10

Author(s):

A. Bravaix ◽

D. Vuillaume

Keyword(s):

Large Angle ◽

Hot Carrier ◽

Deep Submicrometer ◽

Hot Carrier Degradation

Download Full-text

Hot-carrier reliability in deep-submicrometer LATID NMOSFETs

Microelectronics Reliability ◽

10.1016/s0026-2714(99)00300-5 ◽

2000 ◽

Vol 40 (4-5) ◽

pp. 743-746 ◽

Cited By ~ 2

Author(s):

J.M Rafı́ ◽

F Campabadal

Keyword(s):

Hot Carrier ◽

Deep Submicrometer

Download Full-text

Hot-carrier degradation in deep-submicrometer nMOSFETs: lightly doped drain vs. large angle tilt implanted drain

Solid-State Electronics ◽

10.1016/s0038-1101(01)00004-1 ◽

2001 ◽

Vol 45 (8) ◽

pp. 1391-1401 ◽

Cited By ~ 2

Author(s):

J.M. Rafı́ ◽

F. Campabadal

Keyword(s):

Large Angle ◽

Hot Carrier ◽

Deep Submicrometer ◽

Lightly Doped Drain ◽

Hot Carrier Degradation

Download Full-text

Hot-carrier damage in AC-stressed deep submicrometer CMOS technologies

1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) ◽

10.1109/irws.1999.830559 ◽

2003 ◽

Cited By ~ 6

Author(s):

A. Bravaix ◽

D. Goguenheim ◽

N. Revil ◽

E. Vincent

Keyword(s):

Hot Carrier ◽

Deep Submicrometer

Download Full-text

A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET

IEEE Electron Device Letters ◽

10.1109/led.2003.815942 ◽

2003 ◽

Vol 24 (9) ◽

pp. 598-600 ◽

Cited By ~ 4

Author(s):

D.S. Ang ◽

C.H. Ling

Keyword(s):

Hot Carrier ◽

Deep Submicrometer ◽

Hot Carrier Degradation

Download Full-text

RF circuit performance degradation due to soft breakdown and hot-carrier effect in deep-submicrometer CMOS technology

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/22.942565 ◽

2001 ◽

Vol 49 (9) ◽

pp. 1546-1551 ◽

Cited By ~ 38

Author(s):

Qiang Li ◽

Jinlong Zhang ◽

Wei Li ◽

J.S. Yuan ◽

Yuan Chen ◽

...

Keyword(s):

Cmos Technology ◽

Performance Degradation ◽

Circuit Performance ◽

Hot Carrier ◽

Carrier Effect ◽

Deep Submicrometer ◽

Hot Carrier Effect ◽

Soft Breakdown ◽

Rf Circuit

Download Full-text

Performance and hot-carrier reliability of deep-submicrometer CMOS

Hot-Carrier-Induced Damage and Its Spatial Location on RF Noise in Deep-Submicrometer NMOSFETs

Hot carrier stress in deep submicrometer MOSFET's

Hot carrier reliability in deep submicrometer MOSFETs

High-energy tail electrons as the mechanism for the worst-case hot-carrier stress degradation of the deep submicrometer N-MOSFET

Analysis of the hot-carrier degradation of deep-submicrometer large-angle-tilt-implanted drain (LATID) MOSFETs

Hot-carrier reliability in deep-submicrometer LATID NMOSFETs

Hot-carrier degradation in deep-submicrometer nMOSFETs: lightly doped drain vs. large angle tilt implanted drain

Hot-carrier damage in AC-stressed deep submicrometer CMOS technologies

A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET

RF circuit performance degradation due to soft breakdown and hot-carrier effect in deep-submicrometer CMOS technology

Export Citation Format