High-energy tail electrons as the mechanism for the worst-case hot-carrier stress degradation of the deep submicrometer N-MOSFET

2003 ◽  
Vol 24 (7) ◽  
pp. 469-471 ◽  
Author(s):  
D.S. Ang ◽  
T.W.H. Phua ◽  
H. Liao ◽  
C.H. Ling
Keyword(s):  
High Energy ◽  
Worst Case ◽  
Hot Carrier ◽  
High Energy Tail ◽  
Deep Submicrometer ◽  
Hot Carrier Stress ◽  
Stress Degradation

TCAD simulation of hot-carrier stress degradation in split-gate n-channel STI-LDMOS transistors

2020 ◽  
Vol 109 ◽  
pp. 113643
Author(s):  
Federico Giuliano ◽  
Paolo Magnone ◽  
Simone Pistollato ◽  
Andrea Natale Tallarico ◽  
Susanna Reggiani ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
Tcad Simulation

Abnormal Relationship Between Hot Carrier Stress Degradation and Body Current in High-k Metal Gate in the 14-nm Node

2019 ◽  
Vol 40 (4) ◽  
pp. 498-501
Author(s):  
Kai-Chun Chang ◽  
Jih-Chien Liao ◽  
Ting-Chang Chang ◽  
Chien-Hung Yeh ◽  
Chien-Yu Lin ◽  
...  
Keyword(s):  
Metal Gate ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Stress ◽  
Stress Degradation

Hot carrier stress degradation modes in p-type high voltage LDMOS transistors

2009 ◽  
Author(s):  
H. Enichlmair ◽  
J. M. Park ◽  
S. Carniello ◽  
B. Loeffler ◽  
R. Minixhofer ◽  
...  
Keyword(s):  
High Voltage ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
P Type ◽  
Degradation Modes

Inhibiting the Kink Effect and Hot-Carrier Stress Degradation Using Dual-Gate Low-Temperature Poly-Si TFTs

2020 ◽  
Vol 41 (1) ◽  
pp. 54-57 ◽  
Author(s):  
Hong-Chih Chen ◽  
Hong-Yi Tu ◽  
Hui-Chun Huang ◽  
Wei-Chih Lai ◽  
Ting-Chang Chang ◽  
...  
Keyword(s):  
Low Temperature ◽  
Hot Carrier ◽  
Kink Effect ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
Dual Gate

Modeling and characterization of hot-carrier stress degradation in power MOSFETs

2015 ◽  
Author(s):  
Susanna Reggiani ◽  
Elena Gnani ◽  
Antonio Gnudi ◽  
Giorgio Baccarani ◽  
Stefano Poli ◽  
...  
Keyword(s):  
Power Mosfets ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Stress Degradation

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes
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