Improvement of direct-tunneling gate leakage current in ultra-thin gate oxide CMOS with TiN gate electrode using non-doped selective epitaxial Si channel technique

Author(s):  
H.S. Momose ◽  
T. Ohguro ◽  
E. Morifuji ◽  
H. Sugaya ◽  
S. Nakamura ◽  
...  
2000 ◽  
Vol 44 (6) ◽  
pp. 977-980 ◽  
Author(s):  
Jianlin Wei ◽  
Lingfeng Mao ◽  
Mingzhen Xu ◽  
Changhua Tan ◽  
Xiaorong Duan

2012 ◽  
Vol 19 (11) ◽  
pp. 3105-3109
Author(s):  
Shi-gang Hu ◽  
Xiao-Feng Wu ◽  
Zai-fang Xi

2011 ◽  
Vol 58 (5(2)) ◽  
pp. 1518-1521 ◽  
Author(s):  
Heung-Jae Cho ◽  
Younghwan Son ◽  
Sanghoon Lee ◽  
Jong-Ho Lee ◽  
Byung-Gook Park ◽  
...  

2002 ◽  
Vol 49 (12) ◽  
pp. 2288-2295 ◽  
Author(s):  
Leland Chang ◽  
K.J. Yang ◽  
Yee-Chia Yeo ◽  
I. Polishchuk ◽  
Tsu-Jae King ◽  
...  

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