Experimental determination of mobility scattering mechanisms in Si/HfO/sub 2//TiN and SiGe:C/HfO/sub 2//TiN surface channel n- and p-MOSFETs

Author(s):  
O. Weber ◽  
F. Andricu ◽  
M. Casse ◽  
T. Ernst ◽  
J. Mitard ◽  
...  
Author(s):  
A. Agrawal ◽  
A. Ali ◽  
R. Misra ◽  
P. E. Schiffer ◽  
B. R. Bennett ◽  
...  

1998 ◽  
Vol 103 (1) ◽  
pp. 225-235 ◽  
Author(s):  
Timothy K. Stanton ◽  
Dezhang Chu ◽  
Peter H. Wiebe ◽  
Linda V. Martin ◽  
Robert L. Eastwood

1999 ◽  
Vol 96 (6) ◽  
pp. 1111-1116 ◽  
Author(s):  
E. Falcon ◽  
S. Fauve ◽  
C. Laroche

1974 ◽  
Author(s):  
G. E. Robinson ◽  
Frank W. Schmidt ◽  
H. R. Block ◽  
G. Green

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