Transmission electron microscopy characterization of the porous structure induced by high current density in the flip-chip solder joints

2009 ◽  
Author(s):  
Ming-Yen Tsai ◽  
Yen-Liang Lin ◽  
C. Rob
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Current Density ◽  
Flip Chip ◽  
High Current Density ◽  
High Current ◽  
Transmission Electron ◽  
Transmission Electron Microscopy Characterization ◽  
Microscopy Characterization

Transmission Electron Microscopy Characterization of Position-Controlled InN Nanocolumns

2008 ◽  
Vol 47 (7) ◽  
pp. 5330-5332 ◽  
Author(s):  
Satoshi Harui ◽  
Hidetoshi Tamiya ◽  
Takanobu Akagi ◽  
Hideto Miyake ◽  
Kazumasa Hiramatsu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Transmission Electron ◽  
Transmission Electron Microscopy Characterization ◽  
Microscopy Characterization
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