A new off-state drain-bias TDDB lifetime model for DENMOS device

2009 ◽  
Author(s):  
S.W. Chang ◽  
Chia Lin Chen ◽  
C. J. Wang ◽  
Kenneth Wu
Keyword(s):  
Drain Bias ◽  
Lifetime Model

Maximized lifetime model and its solution of layer-based sensor networks

2009 ◽  
Vol 29 (5) ◽  
pp. 1208-1210
Author(s):  
Hui-yong YUAN ◽  
Su-jun LI ◽  
Si-qing YANG ◽  
Jing-guo DAI
Keyword(s):  
Sensor Networks ◽  
Lifetime Model

Drain bias dependent bias temperature stress instability in a-Si:H TFT

2009 ◽  
Vol 53 (2) ◽  
pp. 225-233 ◽  
Author(s):  
Z. Tang ◽  
M.S. Park ◽  
S.H. Jin ◽  
C.R. Wie
Keyword(s):  
Temperature Stress ◽  
Drain Bias ◽  
Bias Temperature Stress

A dependent fatigue lifetime model

1987 ◽  
Vol 16 (4) ◽  
pp. 1181-1193 ◽  
Author(s):  
Enrique Castilio ◽  
Alberto Luceno ◽  
Alejandro Montalban ◽  
Alfonso Fernandez-Canteli
Keyword(s):  
Fatigue Lifetime ◽  
Lifetime Model

Gate-Length and Drain-Bias Dependence of Band-to-Band Tunneling-Induced Drain Leakage in Irradiated Fully Depleted SOI Devices

2008 ◽  
Vol 55 (6) ◽  
pp. 3259-3264 ◽  
Author(s):  
Farah E. Mamouni ◽  
Sriram K. Dixit ◽  
Ronald D. Schrimpf ◽  
Philippe C. Adell ◽  
Ivan S. Esqueda ◽  
...  
Keyword(s):  
Gate Length ◽  
Fully Depleted ◽  
Band To Band Tunneling ◽  
Drain Bias ◽  
Soi Devices
Sign in / Sign up

Export Citation Format

Share Document