Real-time Soft-Error testing of 40nm SRAMs

Author(s):  
J.L. Autran ◽  
S. Serre ◽  
D. Munteanu ◽  
S. Martinie ◽  
S. Semikh ◽  
...  
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2019 ◽  
Vol 103 ◽  
pp. 113515
Author(s):  
Teng Tong ◽  
Zhangang Zhang ◽  
Cunfeng Wei ◽  
Zhifeng Lei ◽  
Mohan Li ◽  
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Author(s):  
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Jin Sun ◽  
Xiumin Zhou ◽  
Tongquan Wei ◽  
Mingsong Chen ◽  
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2014 ◽  
Vol 54 (8) ◽  
pp. 1455-1476 ◽  
Author(s):  
J.L. Autran ◽  
D. Munteanu ◽  
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2017 ◽  
Vol 76-77 ◽  
pp. 53-57 ◽  
Author(s):  
S. Moindjie ◽  
J.L. Autran ◽  
D. Munteanu ◽  
G. Gasiot ◽  
P. Roche

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