2015 IEEE International Reliability Physics Symposium
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9781467373623
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering

2015 ◽  
Author(s):  
Tzu-Cheng Kao ◽  
Chen-Hsin Lien ◽  
Chien-Wei Chiu ◽  
Jian-Hsing Lee ◽  
Yen-Hsiang Lo ◽  
...  
Keyword(s):  
Displacement Current

A novel high level ESD FDNSCR with drain side engineering in PMIC application

2015 ◽  
Author(s):  
Yi-Ning He ◽  
Jhih-Ming Wang ◽  
Tien-Hao Tang ◽  
Kuan-Cheng Su
Keyword(s):  
Drain Side ◽  
High Level

Enhancement mode gallium nitride transistor reliability

2015 ◽  
Author(s):  
Alex Lidow ◽  
Rob Strittmatter ◽  
Chunhua Zhou ◽  
Yanping Ma
Keyword(s):  
Gallium Nitride ◽  
Enhancement Mode ◽  
Transistor Reliability

The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics

2015 ◽  
Author(s):  
Wei-Ting Kary Chien ◽  
Atman Yong Zhao ◽  
Liwen Zhang ◽  
Flora Cheng
Keyword(s):  
Voltage Dependence ◽  
Low K

Impact of DC and RF non-conducting stress on nMOS reliability

2015 ◽  
Author(s):  
A. Cattaneo ◽  
S. Pinarello ◽  
J.-E. Mueller ◽  
R. Weigel
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