2015 IEEE International Reliability Physics Symposium
Latest Publications

TOTAL DOCUMENTS

185

(FIVE YEARS 0)

H-INDEX

14

(FIVE YEARS 0)

Published By IEEE

9781467373623

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112774 ◽

2015 ◽

Author(s):

Wei-Ting Kary Chien ◽

Atman Yong Zhao ◽

Liwen Zhang ◽

Flora Cheng

Keyword(s):

Voltage Dependence ◽

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Impact of DC and RF non-conducting stress on nMOS reliability

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112835 ◽

2015 ◽

Author(s):

A. Cattaneo ◽

S. Pinarello ◽

J.-E. Mueller ◽

R. Weigel

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Understanding the underlying degradation physics for proper time-to-failure distribution selection

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112798 ◽

2015 ◽

Author(s):

J. W. McPherson

Keyword(s):

Proper Time ◽

Time To Failure ◽

Failure Distribution

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A novel high level ESD FDNSCR with drain side engineering in PMIC application

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112795 ◽

2015 ◽

Author(s):

Yi-Ning He ◽

Jhih-Ming Wang ◽

Tien-Hao Tang ◽

Kuan-Cheng Su

Keyword(s):

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Enhancement mode gallium nitride transistor reliability

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112686 ◽

2015 ◽

Author(s):

Alex Lidow ◽

Rob Strittmatter ◽

Chunhua Zhou ◽

Yanping Ma

Keyword(s):

Gallium Nitride ◽

Enhancement Mode ◽

Transistor Reliability

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Probabilistic design for reliability in electronics and photonics: Role, significance, attributes, challenges

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112749 ◽

2015 ◽

Author(s):

E. Suhir ◽

A. Bensoussan ◽

G. Khatibi ◽

J. Nicolics

Keyword(s):

Probabilistic Design ◽

Design For Reliability

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Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112796 ◽

2015 ◽

Author(s):

Tzu-Cheng Kao ◽

Chen-Hsin Lien ◽

Chien-Wei Chiu ◽

Jian-Hsing Lee ◽

Yen-Hsiang Lo ◽

...

Keyword(s):

Displacement Current

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Electrical and reliability performance of atomic layer deposition HfO2 capping layer on porous low dielectric constant materials

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112773 ◽

2015 ◽

Author(s):

Kai-Chieh Kao ◽

Chi-Jia Huang ◽

Chang-Sian Wu ◽

Yi-Lung Cheng

Keyword(s):

Dielectric Constant ◽

Atomic Layer Deposition ◽

Atomic Layer ◽

Low Dielectric Constant ◽

Capping Layer ◽

Low Dielectric ◽

Layer Deposition ◽

Low Dielectric Constant Materials ◽

Reliability Performance

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Keynote Address 2: “Hybrid memory cube: Achieving high performance and high reliability”

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112657 ◽

2015 ◽

Author(s):

Brent Keeth

Keyword(s):

High Performance ◽

High Reliability ◽

Keynote Address ◽

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Phase-change memory: Feasibility of reliable multilevel-cell storage and retention at elevated temperatures

2015 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2015.7112747 ◽

2015 ◽

Author(s):

Milos Stanisavljevic ◽

Aravinthan Athmanathan ◽

Nikolaos Papandreou ◽

Haralampos Pozidis ◽

Evangelos Eleftheriou

Keyword(s):

Phase Change ◽

Elevated Temperatures ◽

Phase Change Memory ◽

Change Memory ◽

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