Test method for moisture-driven failure: Effect of VLSI device self-heating and local temperature rise

2017 ◽  
Author(s):  
Noel Lajo ◽  
Emre Armagan ◽  
Fei Chai ◽  
Sumant Padiyar
Keyword(s):  
Temperature Rise ◽  
Test Method ◽  
Local Temperature ◽  
Local Temperature Rise ◽  
Self Heating

Studies on the Low Local Temperature Rise in the Mirror Facet of a High-Power InGaAsP/GaAs Laser

1992 ◽  
Vol 31 (Part 2, No. 12A) ◽  
pp. L1686-L1688 ◽  
Author(s):  
Jae S. Yoo ◽  
Myeong S. Oh ◽  
Hea S. Park ◽  
Seung T. Jung ◽  
Gueorgui T. Park ◽  
...  
Keyword(s):  
High Power ◽  
Temperature Rise ◽  
Local Temperature ◽  
Local Temperature Rise ◽  
Gaas Laser

Local Temperature Rise during Laser Induced Etching of Gallium Arsenide in SiCl4Atmosphere

1985 ◽  
Vol 24 (Part 2, No. 9) ◽  
pp. L705-L708 ◽  
Author(s):  
Mikio Takai ◽  
Hiroyuki Nakai ◽  
Jun'ichi Tsuchimoto ◽  
Kenji Gamo ◽  
Susumu Namba
Keyword(s):  
Gallium Arsenide ◽  
Temperature Rise ◽  
Local Temperature ◽  
Local Temperature Rise ◽  
Laser Induced Etching
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