A 10-bit 10Ms/s pipeline cyclic ADC based on β-expansion

Author(s):  
Yuta Mishima ◽  
Toshiki Yamada ◽  
Asato Uchiyama ◽  
Tatsuji Matsuura ◽  
Hao San ◽  
...  
Keyword(s):  
2014 ◽  
Vol 35 (3) ◽  
pp. 035005 ◽  
Author(s):  
Kaiming Nie ◽  
Suying Yao ◽  
Jiangtao Xu ◽  
Zhaorui Jiang

2011 ◽  
Vol 32 (2) ◽  
pp. 025008 ◽  
Author(s):  
Hongliang Zhao ◽  
Yiqiang Zhao ◽  
Junfeng Geng ◽  
Peng Li ◽  
Zhisheng Zhang

2016 ◽  
Vol 25 (05) ◽  
pp. 1650038
Author(s):  
Xinji Zeng ◽  
Jing Gao ◽  
Liu Yang ◽  
Jiangtao Xu

This paper presents the design and implementation of an extended-counting incremental sigma–delta ADC (IDC) with hardware-reuse technique. The proposed ADC architecture is a cascaded configuration of a second-order IDC and a two-stage cyclic ADC. The operation of the ADC consists of the “coarse phase” and the “fine phase”. In the “coarse phase”, the circuit works as an IDC to achieve the most significant bits (MSBs) and produce the residue voltage. Then in the “fine phase”, it is reused and changed to work as a cyclic ADC to quantize the residue voltage and achieve the least significant bits (LSBs). Eventual digital output is achieved by combining the two parts together. The utilization of extended-counting technique significantly reduces the conversion time and increases the conversion rate, and the hardware-reuse technique removes the demand for additional circuit area. The ADC is designed in 0.5[Formula: see text][Formula: see text]m CMOS process, which has a conversion rate of 43.48[Formula: see text]kS/s with oversampling ratio (OSR) of 23 and achieves 84.83[Formula: see text]dB SNDR and 13.799-bit ENOB. It consumes 2.4[Formula: see text]mW with a 5[Formula: see text]V voltage supply, and the FOM is 3.87[Formula: see text]pJ/step.


Author(s):  
Eiki Kayama ◽  
Kenta Mori ◽  
Maebou Taichi ◽  
Yuanchi Chen ◽  
Hao San ◽  
...  
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2011 ◽  
Vol 20 (01) ◽  
pp. 57-70 ◽  
Author(s):  
HONGLIANG ZHAO ◽  
YIQIANG ZHAO ◽  
PENG LI ◽  
JUNWEI JIANG ◽  
ZHISHENG ZHANG

A 12-bit cyclic analog to digital converter (ADC) used in long line array infrared sensors readout circuit is presented. The architecture of a low-power amplifier shared with two groups of switched capacitors is used to reduce power consumption. By adding cross-connected switches, the amplifier's offset is effectively canceled out. The improved redundant signed digit (RSD) correction technique is employed to compensate for the error resulting from the comparator's offset in sub-ADC, and the correction technique can tolerate high level of switched capacitor mismatch error, as well. The converter manufactured with Chartered 0.35 μm CMOS process exhibits 0.92 LSB maximum differential nonlinearity (DNL) and 1.5 LSB maximum integral nonlinearity (INL). The ADC has a 69.3 dB signal to noise and distortion ratio (SNDR) at 250 kS/s sample rate and 3 MHz clock frequency. It dissipates 0.8 mW with 3.3 V supply and occupies 0.22 × 0.9 mm2.


Author(s):  
Yuki Watanabe ◽  
Hayato Narita ◽  
Hiroyuki Tsuchiya ◽  
Tatsuji Matsuura ◽  
Hao San ◽  
...  
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