Conveyer Belt Model to Analyze Cycle Time Conditions in a Semiconductor Manufacturing Line

2006 IEEE International Symposium on Semiconductor Manufacturing ◽

10.1109/issm.2006.4493026 ◽

2006 ◽

Author(s):

Toshikazu Inoue ◽

Yoshio Ishii ◽

Kouichi Igarashi ◽

Hideo Takagi ◽

Taka Muneta ◽

...

Keyword(s):

Semiconductor Manufacturing ◽

Conveyer Belt ◽

Manufacturing Line

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Capacity and cycle time-throughput understanding system (CAC-TUS) an analysis tool to determine the components of capacity and cycle time in a semiconductor manufacturing line

10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295) ◽

10.1109/asmc.1999.798198 ◽

2003 ◽

Author(s):

D.P. Martin

Keyword(s):

Semiconductor Manufacturing ◽

Analysis Tool ◽

Manufacturing Line

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Study of cycle time caused by lot arrival distribution in a semiconductor manufacturing line

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513311 ◽

2005 ◽

Author(s):

T. Inoue ◽

Y. Ishii ◽

K. Igarashi ◽

T. Muneta ◽

K. Imaoka

Keyword(s):

Semiconductor Manufacturing ◽

Manufacturing Line

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Total operational efficiency (TOE): the determination of two capacity and cycle time components and their relationship to productivity improvements in a semiconductor manufacturing line

10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295) ◽

10.1109/asmc.1999.798177 ◽

2003 ◽

Author(s):

D.P. Martin

Keyword(s):

Semiconductor Manufacturing ◽

Operational Efficiency ◽

Manufacturing Line

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Maximizing productivity improvements using short cycle time manufacturing (SCM) concepts in a semiconductor manufacturing line

2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) ◽

10.1109/asmc.2000.902559 ◽

2002 ◽

Author(s):

D.P. Martin

Keyword(s):

Semiconductor Manufacturing ◽

Short Cycle ◽

Short Cycle Time ◽

Manufacturing Line

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Litho area cycle time reduction in an advanced 300mm semiconductor manufacturing line

The 17th Annual SEMI/IEEE ASMC 2006 Conference ◽

10.1109/asmc.2006.1638734 ◽

2006 ◽

Author(s):

J. van der Eerden ◽

W. Walbrick ◽

H. Niesing ◽

T. Saenger ◽

R. Schuurhuis

Keyword(s):

Semiconductor Manufacturing ◽

Manufacturing Line ◽

Cycle Time Reduction ◽

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Excursion Yield Loss and Cycle Time Reduction in Semiconductor Manufacturing

IEEE Transactions on Automation Science and Engineering ◽

10.1109/tase.2010.2041450 ◽

2011 ◽

Vol 8 (1) ◽

pp. 112-117 ◽

Author(s):

Robert C. Leachman ◽

Shengwei Ding

Keyword(s):

Semiconductor Manufacturing ◽

Cycle Time Reduction ◽

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Object-oriented hybrid PN model of semiconductor manufacturing line

Proceedings of the 4th World Congress on Intelligent Control and Automation (Cat. No.02EX527) ◽

10.1109/wcica.2002.1020802 ◽

2003 ◽

Author(s):

Zhongjie Wang ◽

Qidi Wu

Keyword(s):

Semiconductor Manufacturing ◽

Object Oriented ◽

Manufacturing Line

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A New Method of Dynamic Bottleneck Detection for Semiconductor Manufacturing Line

IFAC Proceedings Volumes ◽

10.3182/20080706-5-kr-1001.02512 ◽

2008 ◽

Vol 41 (2) ◽

pp. 14840-14845 ◽

Author(s):

Zhongjie Wang ◽

Jun Chen ◽

Qidi Wu

Keyword(s):

Semiconductor Manufacturing ◽

Manufacturing Line ◽

Bottleneck Detection

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A simulated model for cycle time reduction by acquiring optimal lot size in semiconductor manufacturing

The International Journal of Advanced Manufacturing Technology ◽

10.1007/s00170-006-0884-9 ◽

2007 ◽

Vol 34 (9-10) ◽

pp. 1008-1015 ◽

Author(s):

Chia-Nan Wang ◽

Chih-Hong Wang

Keyword(s):

Semiconductor Manufacturing ◽

Lot Size ◽

Simulated Model ◽

Cycle Time Reduction ◽

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Digitalization in Semiconductor Manufacturing- Simulation Forecaster Approach in Managing Manufacturing Line Performance

Procedia Manufacturing ◽

10.1016/j.promfg.2020.01.156 ◽

2019 ◽

Vol 38 ◽

pp. 1330-1337 ◽

Author(s):

Farhain Misrudin ◽

Lee Ching Foong

Keyword(s):

Semiconductor Manufacturing ◽

Manufacturing Simulation ◽

Manufacturing Line

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