Method for testable design and for built-in test

1991 ◽  
Author(s):  
P.G. Petrov
Keyword(s):  
Testable Design

Testable design for cell-based design ASICs and its application to VLSI image signal processor

1993 ◽  
Vol 76 (4) ◽  
pp. 47-56
Author(s):  
Hiroyuki Kawai ◽  
Shin-Ichi Nakagawa ◽  
Masahiko Yoshimoto ◽  
Yasutaka Horiba ◽  
Takuji Ogihara ◽  
...  
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Image Signal Processor ◽  
Testable Design ◽  
Signal Processor

Testable design of large random access memories

Integration ◽  
1984 ◽  
Vol 2 (4) ◽  
pp. 309-330 ◽  
Author(s):  
Kewal K. Saluja ◽  
Kim Thang Le
Keyword(s):  
Random Access ◽  
Testable Design

Delay Testable Design Using Modified Boundary Scan

2021 ◽  
Vol 24 (7) ◽  
pp. 663-667
Author(s):  
Hiroyuki Yotsuyanagi ◽  
Masaki Hashizume
Keyword(s):  
Boundary Scan ◽  
Testable Design

Testable design of multiple-stage OTA-C filters

2000 ◽  
Vol 49 (5) ◽  
pp. 929-934 ◽  
Author(s):  
Cheng-Chung Hsu ◽  
Wu-Shiung Feng
Keyword(s):  
Testable Design
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