Algorithmic and Knowledge-based CAD for VLSI
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9780863412677
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Front Matter

2011 ◽  

Macro-test: a VLSI testable-design technique

2011 ◽  
pp. 180-200
Author(s):  
F. Beenker ◽  
R. Bennetts
Keyword(s):  
Design Technique ◽  
Testable Design

Use of fault augmented functions for automatic test pattern generation

2011 ◽  
pp. 163-179
Author(s):  
N. Jeffrey ◽  
G. Taylor ◽  
B. Bannister ◽  
P. Miller
Keyword(s):  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Automatic Test Pattern Generation ◽  
Automatic Test

HIT: a hierarchical integrated test methodology

2011 ◽  
pp. 142-162
Author(s):  
C. Njinda ◽  
W. Moore
Keyword(s):  
Test Methodology

Back Matter

2011 ◽  
pp. 269-268

Knowledge based test strategy planning

2011 ◽  
pp. 122-141
Author(s):  
C. Dislis ◽  
I. Dear ◽  
A. Ambler
Keyword(s):  
Test Strategy ◽  
Knowledge Based ◽  
Strategy Planning

Expert assistance in digital circuit design

2011 ◽  
pp. 1-23
Author(s):  
Z. Alvi ◽  
J. Noras
Keyword(s):  
Circuit Design ◽  
Digital Circuit ◽  
Digital Circuit Design

An expert systems approach to analogue VLSI layout

2011 ◽  
pp. 201-244
Author(s):  
M. Chowdhury ◽  
R. Massara
Keyword(s):  
Expert Systems ◽  
Systems Approach ◽  
Vlsi Layout ◽  
Analogue Vlsi
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